Ms. Einat H. Louzon Profile

Einat H. Louzon

at Soreq Nuclear Research Ctr

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Publications (1)

Proceedings Article | 7 June 2006 Paper

A decrease in the damage threshold in dielectric materials induced by negatively chirped laser pulses

E. Louzon, Y. Ehrlich, M. Fraenkel, D. Fisher, S. Pecker, Z. Henis, A. Zigler

Proceedings Volume 6261, 62612W (2006) https://doi.org/10.1117/12.667787

KEYWORDS: Ionization, Laser damage threshold, Dielectrics, Silicon, Gallium arsenide, Pulsed laser operation, Picosecond phenomena, Semiconductors, Laser induced damage, Plasma

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