Dr. Erik Bodegom Profile

Dr. Erik Bodegom

Professor and Chair at Portland State Univ

SPIE Involvement:

Author

SPIE Journal Paper | 13 November 2012

Dark current modeling with a moving depletion edge

Justin Dunlap, Morley Blouke, Erik Bodegom, Ralf Widenhorn

JEI, Vol. 21, Issue 4, 043011, (November 2012) https://doi.org/10.1117/12.10.1117/1.JEI.21.4.043011

KEYWORDS: Data modeling, Imaging systems, 3D modeling, Charge-coupled devices, Thermal modeling, Cameras, Electrons, Oxides, Doping, Semiconductors

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Proceedings Article | 15 February 2012 Paper

Dynamic CCD pixel depletion edge model and the effects on dark current production

Justin Dunlap, M. Blouke, Erik Bodegom, Ralf Widenhorn

Proceedings Volume 8298, 82980F (2012) https://doi.org/10.1117/12.909217

KEYWORDS: Data modeling, Imaging systems, Charge-coupled devices, 3D modeling, Cameras, Systems modeling, Oxides, CCD image sensors, Electrons, Camera shutters

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Proceedings Article | 17 February 2011 Paper

Nonlinear time dependence of dark current in charge-coupled devices

Justin Dunlap, Erik Bodegom, Ralf Widenhorn

Proceedings Volume 7875, 78750H (2011) https://doi.org/10.1117/12.871962

KEYWORDS: Cameras, Imaging systems, Electrons, Charge-coupled devices, Sensors, CCD image sensors, Silicon, Signal to noise ratio, Diffusion, Digital imaging

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SPIE Journal Paper | 1 January 2011

Dark current in an active pixel complementary metal-oxide-semiconductor sensor

Justin Dunlap, William Porter, Erik Bodegom, Ralf Widenhorn

JEI, Vol. 20, Issue 1, 013005, (January 2011) https://doi.org/10.1117/12.10.1117/1.3533328

KEYWORDS: Sensors, Imaging systems, Cameras, CMOS sensors, Temperature metrology, Photodiodes, Silicon, Camera shutters, Charge-coupled devices, Image sensors

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SPIE Journal Paper | 1 April 2010

Charge diffusion in the field-free region of charge-coupled devices

Ralf Widenhorn, Alexander Weber, Morley Blouke, Albert Bae, Erik Bodegom

OE, Vol. 49, Issue 04, 044401, (April 2010) https://doi.org/10.1117/12.10.1117/1.3386514

KEYWORDS: Diffusion, Charge-coupled devices, Electrons, Data modeling, Monte Carlo methods, Back illuminated sensors, Sensors, Optical engineering, Spatial resolution, Absorption

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Proceedings Article | 26 January 2010 Paper

Characterization and correction of dark current in compact consumer cameras

Justin Dunlap, Erik Bodegom, Ralf Widenhorn

Proceedings Volume 7536, 75360J (2010) https://doi.org/10.1117/12.840440

KEYWORDS: Cameras, Imaging systems, Image processing, Standards development, Temperature metrology, CCD image sensors, Digital cameras, Interference (communication), Sensors, Image quality

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SPIE Journal Paper | 1 January 2010

Correction of dark current in consumer cameras

Justin Dunlap, Erik Bodegom, Ralf Widenhorn

JEI, Vol. 19, Issue 01, 013010, (January 2010) https://doi.org/10.1117/12.10.1117/1.3358365

KEYWORDS: Cameras, Imaging systems, Denoising, Temperature metrology, Sensors, Manufacturing, Image processing, Interference (communication), Digital filtering, Calibration

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SPIE Journal Paper | 1 July 2009

Influence of illumination on dark current in charge-coupled device imagers

Ralf Widenhorn, Ines Hartwig, Justin Dunlap, Erik Bodegom

JEI, Vol. 18, Issue 03, 033015, (July 2009) https://doi.org/10.1117/12.10.1117/1.3222943

KEYWORDS: Charge-coupled devices, Cameras, Camera shutters, Electrons, Imaging systems, Silicon, Sensors, Light emitting diodes, Optical testing, Diodes

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Proceedings Article | 28 January 2009 Paper

Dark current behavior in DSLR cameras

Justin Dunlap, Oleg Sostin, Ralf Widenhorn, Erik Bodegom

Proceedings Volume 7249, 72490N (2009) https://doi.org/10.1117/12.806128

KEYWORDS: Cameras, Imaging systems, Denoising, Sensors, Temperature metrology, Manufacturing, Calibration, Charge-coupled devices, Optical filters, Digital filtering

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Proceedings Article | 4 March 2008 Paper

Measurements of dark current in a CCD imager during light exposures

Ralf Widenhorn, Ines Hartwig, Justin Dunlap, Erik Bodegom

Proceedings Volume 6816, 68160B (2008) https://doi.org/10.1117/12.769082

KEYWORDS: Charge-coupled devices, Cameras, Camera shutters, Electrons, Imaging systems, Silicon, Light emitting diodes, Light, Optical testing, Digital imaging

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Proceedings Article | 29 February 2008 Paper

Dark current measurements in a CMOS imager

William Porter, Bradley Kopp, Justin Dunlap, Ralf Widenhorn, Erik Bodegom

Proceedings Volume 6816, 68160C (2008) https://doi.org/10.1117/12.769079

KEYWORDS: Imaging systems, Temperature metrology, Cameras, CMOS sensors, Sensors, Photodiodes, Charge-coupled devices, Data acquisition, Diffusion, CCD image sensors

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Proceedings Article | 21 February 2007 Paper

Computation of dark frames in digital imagers

Ralf Widenhorn, Armin Rest, Morley Blouke, Richard Berry, Erik Bodegom

Proceedings Volume 6501, 650103 (2007) https://doi.org/10.1117/12.714784

KEYWORDS: Temperature metrology, Cameras, Imaging systems, Calibration, Electrons, Signal to noise ratio, Temperature sensors, Astronomy, Charge-coupled devices, Control systems

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Proceedings Article | 7 March 2005 Paper

Infrared response of charge-coupled devices

Matthias Loch, Ralf Widenhorn, Erik Bodegom

Proceedings Volume 5677, (2005) https://doi.org/10.1117/12.610650

KEYWORDS: Quantum efficiency, Infrared radiation, Electrons, Semiconductor lasers, Monochromators, Charge-coupled devices, Silicon, Sensors, Linear filtering, Visible radiation

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Proceedings Article | 16 May 2003 Paper

PSF measurements on back-illuminated CCDs

Ralf Widenhorn, Alexander Weber, Morley Blouke, Albert Bae, Erik Bodegom

Proceedings Volume 5017, (2003) https://doi.org/10.1117/12.482797

KEYWORDS: Charge-coupled devices, Diffusion, Electrons, Data modeling, Point spread functions, Back illuminated sensors, Monte Carlo methods, Modulation transfer functions, Spatial resolution, Light sources

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Proceedings Article | 24 April 2002 Paper

Temperature dependence of dark current in a CCD

Ralf Widenhorn, Morley Blouke, Alexander Weber, Armin Rest, Erik Bodegom

Proceedings Volume 4669, (2002) https://doi.org/10.1117/12.463446

KEYWORDS: Charge-coupled devices, Diffusion, Dielectrophoresis, Electrons, Silicon, Data modeling, Temperature metrology, Diodes, Back illuminated sensors, Semiconductors

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