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Significant research efforts have been invested in attempting to reliably capture and visualize holograms since their
inception in 1962. However, less attention has been given to the efficient digital representation of the recorded
holograms, which differ considerably from digitally recorded photographs. This paper examines the properties of
recorded off-axis holograms and attempts to find a suitable sparse representation for holographic data. Results show
significantly improved Bjøntegaard delta PSNR of over 4.5 dB on average within a bit-rate range of 0.125 to 2 bpp when
combining the direction-adaptive discrete wavelet transform with non-standard decomposition schemes for off-axis
holographic recordings; up to 7.5% reduction of file size has been achieved in the lossless case.
A metal has a typical grey "metallic" look. Different colours can appear when the metallic surface is covered with a thin
transparent layer. This is of course the result of interference, and consequently the colour depends on the optical
thickness of the layer. Experimental observations can be completely predicted by theoretical modelling. Using the
Fresnel equations the colour can be calculated within excellent agreement of the experimental observations. Fresnel, of
course, assumes perfectly flat surfaces. Roughness complicates matters: the optical path within the coating no longer
depends on the local thickness of the coating only, but also on the angle of scattering at the underlying metal, both
varying from point to point.
In this presentation we describe how the roughness can be taken into account in predicting the colour. The scattered light
was calculated using the "Modeled Integrated Scattering Tool", a computer program developed at the "National
Institute of Standards and Technology" (USA). The non-uniformity of the coatings was taken into account by
considering different coatings thicknesses. The resulting colour is calculated by taking the average of the obtained
reflections. Finally the colours were measured with a spectrophotometer.
It turned out that the modelled and the measured colours agree very well, confirming the validity of the used model.
The appearance of an object is strongly influenced by the reflective properties of its surface. These properties
are governed by the optical constants of the material, its roughness and the thickness and optical properties
of the coatings. In this paper we study rough steel substrates covered with thermal grown oxide layers. The
optical constants, thickness and roughness of the sample were measured and they were used as parameters in a
model to simulate the reflection of the samples. These simulated reflections correspond well with experimental
scatterometry measurements. Using these data we were able to predict the colour and the gloss of the samples.
This opens the possibility to design the colour and the gloss of coated steel according to the wishes of the
users.
A growing trend in architecture and design is the use of steel. For those applications the visual appearance of
the surface is of primordial importance. In this research we model the reflection of light on a rough steel surface,
coated with a transparent polymer layer. A number of optical non-destructive techniques were used to determine
the roughness (AFM, white light scattering interferometry) and optical constants (spectroscopic ellipsometry) of
the samples. AFM measurements were used to determine whether this polymer layer followed the roughness of
the substrate or had a roughness all of its own. Using the Modeled Integrated Scattering Tool (MIST) developed
by the National Institute of Standards and Technology (NIST) we were able to calculate the reflection of these
surfaces and compare them to experimental reflections measured by scatterometry.
NEMO is the European "Network of Excellence on Micro-Optics". One of the objectives is to disseminate knowledge on micro-optics. Therefore NEMO plans to inform pupils about the crucial role of micro-optics This is done through the distribution of an educational kit to their physics/technology teachers. This kit has been realized through a cooperative action of different partners of the NEMO-network all over Europe. It contains a variety of replicated micro-optical refractive and diffractive components, and a semiconductor laser source. The kit is supplemented with a CD-ROM which explains the basic concepts and describes possible experiments and experimental setups. It contains also a computer tutorial which simulates the optical processes of image formation.
It is hoped that this will encourage interest in optics and, more generally, in science as an area of future study and as a possible career choice.
At the conference the realization and the lay out of the EduKit will be commented and a demonstration will be given.
The design and fabrication of a demonstration kit (EduKit) for secondary school students is described. We
present the final iteration of the layout of the EduKit and outline some of the simple experiments which the kit
is intended to show. The mass replication techniques used in the production of this project are described and
the final educational outcomes of the project are discussed.
NEMO is a European "Network of Excellence in Micro-Optics" One of the objectives is to disseminate knowledge on micro-optics. Therefore NEMO plans to inform pupils about the crucial role of micro-optics This will be done through the distribution of an educational kit to their physics/technology teachers. The kit will contain a variety of replicated micro-optical refractive and diffractive components, and a semiconductor laser source. The kit will be supplemented with a booklet with DVD. Possible experiments and experimental setups are proposed, explained and illustrated. On the same DVD some simple optical designs will also be illustrated.
Optimization of the optical quality of optical-grade germanium components requires an in-depth investigation of the different contributions to the optical loss in germanium. In this paper we therefore focus on this optical characterization. We give an overview of possible characterization techniques to determine surface roughness, surface/bulk absorption and refractive index inhomogeneities and we highlight the obtained optical characteristics. To conclude we select the most appropriate non-destructive characterization tool for each optical parameter.
Visible spectroscopic ellipsometry is applied to monitor in-situ the behaviour of metal and metal oxides in various aqueous solutions. Ellipsometry measures the change in polarisation state upon reflection on a sample and is widely used for the determination of the optical properties of surfaces and thin films. The technique has the advantage that no reference measurements are needed. The use of in-situ ellipsometry in the fields of electrochemistry and corrosion is illustrated by means of three cases. These show the possibilities to obtain film thickness, film refractive index, and the surface roughness of the metal. The first case is related to oxide films on aluminium. For the native oxide (several nm thick) on the metal the roughening of the substrate as well as the changes in oxide film thickness can be observed independently. On thicker oxides (> 100 nm), it is possible to independently determine in-situ the refractive index and thickness of the oxide, as well as the interface roughness. This was shown in a study of the effect of aggressive solution son aluminium/aluminium oxide surface. The second case concerns the electrochemical polishing process of copper. A good coincidence is achieved between the interface roughness and layer thickness from ellipsometry and the expected surface structure for the different electrochemical conditions. A last example shows the possibility of ellipsometry to study the copper corrosion in an aggressive solution. For this case, the thickness and the refractive index of the corrosion film can only be obtained in that part of the spectrum where the oxide is transparent. The degree of corrosion protection was characterised by monitoring the protective film thickness.
A technique and device for recording and copying reflection holograms (Denisyuk's holograms) with a semiconductor laser, emitting in the visible spectral range ((lambda) equals 672 mm), are described. Superfine-grain silver halide Bulgarian materials HP-650 are utilized, ensuring high values of diffraction efficiency without bleaching after development. The major operating characteristics are determined and the possibility of holographic recording of real objects with vertical and horizontal positioning is demonstrated. The technique and device can find application in the realization of replicas of museum items, unique and rare specimens in the premises where they are stored, or archeological excavation findings during excavation, without the need of transporting the objects to the holographic laboratory.
In this paper some setups are described for demonstrating the basics of diffractive and/or Fourier optics. It is first shown that the eye in fact can be used as a Fourier transformer: this makes the setups extremely simple. When using one extra lens, a 4-f processor can be built, by which such properties as, e.g., filtering can be demonstrated.
We present two types of polarizing holographic optical elements recorded in Du Pont's Omnidex film (reflection holograms). The first one takes benefit of the dry development process in order to respect the grating geometry associated with polarization properties. Thanks to that, we realized polarizing beam splitter with high diffraction efficiency and high polarization ratio. The second type of polarizer is an original polarizing mirror that is based on the polarization dependency of spectral and angular selectivities. The high index modulation of that polymer allows to record new holographic polarizers. Details about theoretical basis and experimental realization are given.
In (synthetic) holography and diffractive optics, the optical field is often decomposed in a set of spherical or plane waves. This gives sometimes some problems in calculating the Fourier transform. Because Gaussian beams are their own Fourier transform, it seems to be more natural to use Gaussian beams as basis functions. However, because Gaussian functions are no complete set of basis functions, it is necessary to extend the idea and to use rather Gaussian-Hermite wave functions as an orthonormal basis set. Those ideas can also be applied to general Self-Fourier Transform functions.
In this contribution we recognize that it is possible to obtain an achromatized version of a selected Fresnel diffraction pattern of an input transparency, using a single on-axis blazed zone plate. The input is illuminated by a polychromatic converging spherical beam and the zone plate is inserted at the source plane. In this optical configuration, the position of the input transparency along the optical axis permits to select the Fresnel diffrac- tion field to be achromatized. In this way, we are able to record, at finite distances, a wide range of diffraction patterns with a low chromatic aberration over the entire visible spectrum.
Most optical setups used for accurate angle measurement have only a limited measurement range. An extension in which the total range is increased to a theoretical range of +90 to -90 deg (one-prism setup) or +60 to -60 deg (two-prism setup) with an angular resolution of 3.34 x 10-5 deg is presented. The accuracy is also discussed.
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