Eyal Angel
at Applied Materials Israel Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12955, 1295519 (2024) https://doi.org/10.1117/12.3010756
KEYWORDS: Data modeling, Metrology, Process control, Scanning electron microscopy, Deep learning, Neural networks, Mathematical optimization, Machine learning, Critical dimension metrology

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