Dr. Fabian Friederich Profile

Dr. Fabian Friederich

Group Manager at Fraunhofer-ITWM

SPIE Involvement:

Conference Program Committee | Author

Proceedings Article | 18 June 2024 Presentation

Inspection of electrodes in battery production using a multi-channel photonic terahertz radar

Shiva Mohammadzadeh, Andreas Keil, Raphael Hussung, Lauri Maximilian Schwenson, Lars Liebermeister, Robert Kohlhaas, Fabian Friederich

Proceedings Volume PC12994, PC129940G (2024) https://doi.org/10.1117/12.3017467

KEYWORDS: Electrodes, Radar, Inspection, Batteries, Film thickness, Laser frequency, Imaging arrays, Electrical conductivity, Transmitters, Tissue optics

Read Abstract +

Proceedings Article | 14 March 2018 Presentation

Multilayer thickness inspection with millimeter-waves (Conference Presentation)

Nina Schreiner, Wolfgang Sauer-Greff, Ralph Urbansky, Fabian Friederich

Proceedings Volume 10531, 105310P (2018) https://doi.org/10.1117/12.2300761

KEYWORDS: Inspection, Radar

Read Abstract +

Proceedings Article | 14 March 2018 Presentation

Millimeter-wave imaging solutions for non-destructive testing (Conference Presentation)

Fabian Friederich

Proceedings Volume 10531, 105310R (2018) https://doi.org/10.1117/12.2300758

KEYWORDS: Millimeter wave imaging, Nondestructive evaluation

Read Abstract +

Proceedings Article | 24 February 2017 Presentation + Paper

Conception and realization of a semiconductor based 240 GHz full 3D MIMO imaging system

Christian Weisenstein, Matthias Kahl, Fabian Friederich, Peter Haring Bolívar

Proceedings Volume 10103, 101030B (2017) https://doi.org/10.1117/12.2250892

KEYWORDS: Defect detection, Synthetic aperture imaging, Terahertz technology, Composites, Semiconductors, 3D image processing, Imaging systems, Nondestructive evaluation, 3D image reconstruction, Receivers, Transmitters, Point spread functions

Read Abstract +

SPIE Journal Paper | 21 March 2014

Nondestructive testing potential evaluation of a terahertz frequency-modulated continuous-wave imager for composite materials inspection

Edison Cristofani, Fabian Friederich, Sabine Wohnsiedler, Carsten Matheis, Joachim Jonuscheit, Marijke Vandewal, René Beigang

OE, Vol. 53, Issue 03, 031211, (March 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.3.031211

KEYWORDS: Terahertz radiation, Inspection, Sensors, Nondestructive evaluation, Spatial resolution, Composites, Continuous wave operation, Imaging systems, Solids, Lenses

Read Abstract +

Proceedings Article | 26 February 2008 Paper

Laser beam shaping for micromaterial processing using a liquid crystal display

U. Klug, M. Boyle, F. Friederich, R. Kling, A. Ostendorf

Proceedings Volume 6882, 688207 (2008) https://doi.org/10.1117/12.763542

KEYWORDS: Diffraction, Beam shaping, Spatial light modulators, Micromachining, Quantization, Signal to noise ratio, Stars, Liquid crystal on silicon, Diodes, LCDs

Read Abstract +

Showing 5 of 6 publications

Conference Committee Involvement (8)

Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVIII

27 January 2025 | San Francisco, California, United States

Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVII

29 January 2024 | San Francisco, California, United States

Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVI

30 January 2023 | San Francisco, California, United States

Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV

25 January 2022 | San Francisco, California, United States

Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIV

6 March 2021 | Online Only, California, United States

Showing 5 of 8 Conference Committees

Keywords/Phrases

Search In:

Publication Years