Dr. Fei Li Profile

Dr. Fei Li

at National Institute of Metrology

SPIE Involvement:

Author

Publications (9)

Proceedings Article | 29 December 2023 Paper

Liquid-based scattering microspheres phantom for resolution evaluation of optical coherence tomography

Lei Yang, Liangcheng Duan, Xiang Ma, Xiaowei Zhao, Fei Li, Baoyu Hong, Wenli Liu, Zhixiong Hu

Proceedings Volume 12975, 129750O (2023) https://doi.org/10.1117/12.3015627

Read Abstract +

Proceedings Article | 18 December 2023 Paper

Investigation of the ophthalmic optical coherence tomography lateral resolution measurement using the standard test method

Xiaowei Zhao, Wenli Liu, Zhixiong Hu, Liangcheng Duan, Qingqing Wang, Xing Wei, Fei Li, Baoyu Hong

Proceedings Volume 12963, 129631T (2023) https://doi.org/10.1117/12.3000080

KEYWORDS: Optical coherence tomography, Standards development, Image resolution, Image quality standards, Point spread functions, Eye

Read Abstract +

Proceedings Article | 19 December 2022 Poster + Paper

Development of geometric parameters metrology system for contact lens based on spectral-domain OCT

Liangcheng Duan, Wenli Liu, Zhixiong Hu, Xiang Ma, Fei Li, Baoyu Hong, Junbang Zhao

Proceedings Volume 12320, 1232021 (2022) https://doi.org/10.1117/12.2643956

KEYWORDS: Optical coherence tomography, Calibration, Metrology, Technology, Imaging systems, Contact lenses, Image processing, Signal to noise ratio, Signal processing, LabVIEW

Read Abstract +

Proceedings Article | 5 November 2020 Paper

Measurement error of spatial frequency response based on sinusoidal Siemens Star

Runjia Yang, Fei Li, Baoyu Hong, Zhixiong Hu

Proceedings Volume 11567, 115673V (2020) https://doi.org/10.1117/12.2580250

KEYWORDS: Stars, Spatial frequencies, Modulation, Metrology, Image processing, Detection and tracking algorithms, Calibration, Target recognition, Phase shifts

Read Abstract +

Proceedings Article | 10 October 2020 Presentation + Paper

Measurement of refractive index of optical materials using improved Brewster method

Jiahang Lv, Yao Hu, Fei Li, Qun Hao

Proceedings Volume 11548, 115480V (2020) https://doi.org/10.1117/12.2573606

KEYWORDS: Refractive index, Prisms, Reflectivity, Polarization, Photodiodes, Spherical lenses, Aspheric lenses, Laser beam diagnostics, Detector arrays, Sensors

Read Abstract +

Proceedings Article | 31 January 2020 Paper

Two-step phase-shifting sectioning structured illumination microscopy

Hongting Wang, Zhixiong Hu, Wenli Liu, Fei Li, Xiuyu Li

Proceedings Volume 11427, 1142713 (2020) https://doi.org/10.1117/12.2551040

KEYWORDS: Phase shifts, Microscopy, Image retrieval, 3D metrology

Read Abstract +

Proceedings Article | 19 October 2016 Paper

A method to enhance the measurement accuracy of Raman shift based on high precision calibration technique

Xiang Ding, Fei Li, Jiyan Zhang, Wenli Liu

Proceedings Volume 10155, 101551D (2016) https://doi.org/10.1117/12.2246234

KEYWORDS: Raman spectroscopy, Precision calibration, Calibration, Silicon

Read Abstract +

Proceedings Article | 15 October 2012 Paper

Application of laser differential confocal technique in back vertex power measurement for phoropters

Fei Li, Lin Li, Xiang Ding, Wenli Liu

Proceedings Volume 8417, 84171N (2012) https://doi.org/10.1117/12.975924

KEYWORDS: Confocal microscopy, Error analysis, Mirrors, Standards development, Lenses, Sensors, Spherical lenses, Optical components, Calibration, Objectives

Read Abstract +

Proceedings Article | 15 October 2012 Paper

New approach to accuracy enhancement and traceability realization of radius of curvature measurement

Xiang Ding, Fei Li, Wenli Liu

Proceedings Volume 8417, 84171O (2012) https://doi.org/10.1117/12.975818

KEYWORDS: Optical spheres, Confocal microscopy, Spherical lenses, Mathematical modeling, Profilometers, Calibration, Metrology, Optical testing, Interferometry, Standards development

Read Abstract +

Showing 5 of 9 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years