Dr. François Deneuville Profile

Dr. François Deneuville

at ISP Systems

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Author

Publications (5)

Proceedings Article | 15 March 2023 Presentation + Paper

Bloch mode analysis of subwavelength polarizing planar optics

R. Mulin, F. Deneuville, O. Jeannin, M. Boffety, J. Vaillant

Proceedings Volume 12432, 1243204 (2023) https://doi.org/10.1117/12.2646194

KEYWORDS: Optical gratings, Silicon, Polarization, Wave propagation, Image processing, Refractive index, Immersion lithography, Data modeling, Semiconducting wafers, CMOS sensors

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Proceedings Article | 12 May 2015 Paper

Large aperture adaptive optics for intense lasers

François Deneuville, Laurent Ropert, Paul Sauvageot, Sébastien Theis

Proceedings Volume 9513, 95130I (2015) https://doi.org/10.1117/12.2178848

KEYWORDS: Actuators, Mirrors, Deformable mirrors, Electromechanical design, Pulsed laser operation, Laser development, Wavefronts, Monochromatic aberrations, Adaptive optics, Laser optics

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Proceedings Article | 20 February 2015 Paper

Adaptive optics for ultra short pulsed lasers in UHV environment

Francois Deneuville, Laurent Ropert, Paul Sauvageot, Sébastien Theis

Proceedings Volume 9346, 934611 (2015) https://doi.org/10.1117/12.2077414

KEYWORDS: Actuators, Mirrors, Deformable mirrors, Adaptive optics, Pulsed laser operation, Laser development, High power lasers, Head, Glasses, Silicon

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Proceedings Article | 3 May 2013 Paper

An interferometric diagnostic for the experimental study of dynamics of solids exposed to intense and ultrashort radiation

C. Fourment, F. Deneuville, B. Chimier, D. Descamps, F. Dorchies, S. Hulin, S. Petit, O. Peyrusse, J. Santos

Proceedings Volume 8777, 87770M (2013) https://doi.org/10.1117/12.2018982

KEYWORDS: Aluminum, Electrons, Picosecond phenomena, Dielectrics, Phase shifts, Interfaces, Diagnostics, Dielectric polarization, Optical properties, Oxides

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Proceedings Article | 5 October 2011 Paper

Spectroscopic studies of hard x-ray free-electron laser-heated foils at 1016 Wcm-2 irradiances

J. Dunn, R. Shepherd, A. Graf, A. Steel, J. Park, S. Moon, R. Lee, P. Audebert, A. Levy, M. Gauthier, J. Fuchs, D. Fritz, M. Cammarata, D. Milathianaki, H. J. Lee, B. Nagler, C. Fourment, F. Deneuville, G. Williams, M. Fajardo, J. Gaudin, S. Vinko, O. Ciricosta, J. Wark, H. Chung

Proceedings Volume 8140, 81400O (2011) https://doi.org/10.1117/12.895264

KEYWORDS: X-rays, Free electron lasers, Silver, Crystals, Hard x-rays, Spectrometers, Copper, Diagnostics, Picosecond phenomena, Spectroscopy

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