Dr. Gaurav K. Agrawal
Member of Technical Staff at GlobalFoundries
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 2 April 2014 Paper
Proceedings Volume 9050, 90500Q (2014) https://doi.org/10.1117/12.2046331
KEYWORDS: Lithography, Control systems, Semiconducting wafers, Metrology, Process control, Manufacturing, Databases, Algorithm development, Statistical analysis, Semiconductor manufacturing

Proceedings Article | 10 April 2013 Paper
Alok Vaid, Lokesh Subramany, Givantha Iddawela, Carl Ford, John Allgair, Gaurav Agrawal, John Taylor, Carsten Hartig, Byung Cheol (Charles) Kang, Cornel Bozdog, Matthew Sendelbach, Paul Isbester, Limor Issascharoff
Proceedings Volume 8681, 868103 (2013) https://doi.org/10.1117/12.2012339
KEYWORDS: Metrology, Semiconducting wafers, Critical dimension metrology, Transmission electron microscopy, Etching, Process control, Reactive ion etching, Data modeling, High volume manufacturing

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