Mr. Gino Rinaldi Profile

Gino Rinaldi

Graduate Research Assistant at Concordia Univ

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Author

Publications (5)

Proceedings Article | 12 October 2005 Paper

Multi-parameter synthesis of microsystems

Gino Rinaldi, Muthukumaran Packirisamy, Ion Stiharu

Proceedings Volume 5970, 597016 (2005) https://doi.org/10.1117/12.628604

KEYWORDS: Microsystems, Mathematical modeling, Microfabrication, Microelectromechanical systems, Thermal effects, Performance modeling, Tolerancing, Motion models, Silicon, Systems modeling

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Proceedings Article | 12 October 2005 Paper

Thermo-electrical influence on static and dynamic behaviour of cantilever type silicon waveguide

Gino Rinaldi, Muthukumaran Packirisamy, Ion Stiharu

Proceedings Volume 5970, 597017 (2005) https://doi.org/10.1117/12.628601

KEYWORDS: Microsystems, Mathematical modeling, Silicon, Waveguides, Microelectromechanical systems, Electrodes, Microfabrication, Atomic force microscopy, Thermal modeling, Motion models

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Proceedings Article | 20 December 2004 Paper

Optical MEMS-based bimorph for thermal sensing

Gino Rinaldi, Muthukumaran Packirisamy, Ion Stiharu

Proceedings Volume 5577, (2004) https://doi.org/10.1117/12.567508

KEYWORDS: Atomic force microscopy, Thermal sensing, Temperature metrology, Microelectromechanical systems, Aluminum, Microopto electromechanical systems, Sensors, Silicon, Coating, Thermography

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Proceedings Article | 16 November 2004 Paper

Polyimide-based fiber optic humidity sensor

Xing Li, Gino Rinaldi, Muthukumaran Packirisamy, Ion Stiharu

Proceedings Volume 5579, (2004) https://doi.org/10.1117/12.567500

KEYWORDS: Humidity, Fiber optics sensors, Sensors, Fiber optics, Absorption, Transmittance, Glasses, Infrared spectroscopy, Coating, Resistance

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Proceedings Article | 16 August 2004 Paper

Experimental investigation on the dynamics of MEMS structures

Gino Rinaldi, Muthukumaran Packirisamy, Ion Stiharu

Proceedings Volume 5455, (2004) https://doi.org/10.1117/12.547544

KEYWORDS: Microelectromechanical systems, Laser Doppler velocimetry, Atomic force microscopy, Doppler effect, Testing and analysis, Microfabrication, Scanning electron microscopy, Microsystems, Motion measurement, Manufacturing

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