Prof. Gunther Notni
Senior Director / Sensors and Metrology at Fraunhofer-IOF
SPIE Involvement:
Conference Program Committee | Author
Publications (168)

SPIE Journal Paper | 21 August 2024 Open Access
Wang Liao, Chen Zhang, Belmin Alić, Alina Wildenauer, Sarah Dietz-Terjung, Jose Guillermo Ortiz Sucre, Sivagurunathan Sutharsan, Christoph Schöbel, Karsten Seidl, Gunther Notni
JBO, Vol. 29, Issue S3, S33309, (August 2024) https://doi.org/10.1117/12.10.1117/1.JBO.29.S3.S33309
KEYWORDS: Video, 3D image processing, Cameras, Feature extraction, 3D metrology, RGB color model, Near infrared, Oxygen, Convolutional neural networks, 3D modeling

Proceedings Article | 7 June 2024 Presentation + Paper
Christoph Freitag, Stefan Heist, Andreas Stark, Peter Kühmstedt, Gunther Notni, Christian Franke
Proceedings Volume 13038, 130380B (2024) https://doi.org/10.1117/12.3013188
KEYWORDS: Structured light, Light sources and illumination, 3D metrology, Projection systems, Stereoscopic cameras, Point clouds, Calibration, Sensors

Proceedings Article | 7 June 2024 Presentation + Paper
Proceedings Volume 13038, 1303803 (2024) https://doi.org/10.1117/12.3012571
KEYWORDS: 3D metrology, Diffractive optical elements, Cameras, Gas lasers, Beam diameter, Long wavelength infrared, 3D modeling, Thermography

Proceedings Article | 7 June 2024 Presentation + Paper
Proceedings Volume 13038, 130380D (2024) https://doi.org/10.1117/12.3013402
KEYWORDS: Glasses, Long wavelength infrared, Temperature distribution, 3D metrology, Reflection, Laser radiation, Cameras, Short wave infrared radiation, Thermal imaging cameras, Optical surfaces

Proceedings Article | 7 June 2024 Presentation + Paper
Proceedings Volume 13038, 1303804 (2024) https://doi.org/10.1117/12.3017783
KEYWORDS: Sensors, RGB color model, 3D metrology, Polarization, 3D modeling, Opacity, Cameras, Near infrared, Pose estimation, Image segmentation

Showing 5 of 168 publications
Conference Committee Involvement (27)
Optical Measurement Systems for Industrial Inspection XIV
23 June 2025 | Munich, Germany
Dimensional Optical Metrology and Inspection for Practical Applications XIV
13 April 2025 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications XIII
24 April 2024 | National Harbor, Maryland, United States
Optical Measurement Systems for Industrial Inspection XIII
26 June 2023 | Munich, Germany
Dimensional Optical Metrology and Inspection for Practical Applications XII
2 May 2023 | Orlando, Florida, United States
Showing 5 of 27 Conference Committees
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