Gyo-Hun Koo
at Kyungpook National Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 June 2013 Paper
Gyo-hun Koo, Young-Chul Jung, Sung-Ho Hahm, Dong-Geon Jung, Yong Soo Lee
Proceedings Volume 8704, 87041P (2013) https://doi.org/10.1117/12.2015676
KEYWORDS: Microbolometers, Oxygen, Nickel, Sputter deposition, Oxides, Thin films, Scanning electron microscopy, Resistance, Temperature metrology, X-ray diffraction

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