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Han Yen Tan
at Monash Univ
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Publications (1)
SPIE Journal Paper | 1 October 2008
Light-emitting-diode inspection using a flatbed scanner
OE, Vol. 47, Issue 10, 103602, (October 2008) https://doi.org/10.1117/12.10.1117/1.2995991
KEYWORDS: Light emitting diodes, Scanners, Inspection, Light sources, Blue light emitting diodes, Spatial resolution, Optical engineering, Goniophotometry, Defect detection, LCDs
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