The mid-infrared (mid-IR) is an important wavelength range for vibrational absorption spectroscopy (e.g. for gas sensing, medical diagnostics, environmental monitoring), and thus there is a strong need for small and stable on-chip spectrometers. It is also desirable for it to be inexpensive to fabricate and for it to be able to perform high-resolution measurements over a wide bandwidth. To this end, we demonstrate two kinds of mid-IR thermo-optic type Fourier Transform spectrometers (FTS). Both variations of the device are designed to target a central wavelength of 3.8 μm and are based on the silicon-on-insulator platform. These two devices are verified by using them to retrieve the spectrum of a quantum cascade laser when it is tuned to different wavelengths. They have the potential to achieve higher resolution and bandwidth through subsequent design optimization, and could in future be integrated with mid-infrared photodetectors.
High-speed (upwards of 105 coordinates s-1) and long-range (~10 m) absolute distance measurement applications based on frequency scanning interferometry (FSI) generate very high modulation frequencies (typically >100 GHz) due to the laser frequency sweep rate and the large imbalance between the reference and object arms. Such systems are currently impractical due to the extremely high cost associated with sampling at these signal frequencies. Adaptive delay lines (ADLs) were recently proposed as a solution to balance the interferometer and therefore reduce sampling rate requirements by a factor of 2N, where N is the number of switches in the ADL [1, 2]. The technique has been successfully demonstrated in the lab using bulk optics and optical fiber configurations, and further reduction in size and cost will increase the breadth of metrology applications that can be addressed. Silicon photonics constitute an effective platform to miniaturize ADLs to chip-scale, simplifying instrument manufacture and providing a more robust configuration compared to bulk-optics and fiber-based solutions. We discuss the design and fabrication of chip-scale ADLs on a silicon on insulator (SOI) photonics platform, using optical switches based on heaters, multi-mode interferometer (MMI) couplers and Mach-Zehnder interferometers (MZI). We also establish the heater voltages of 4 switches in series, required to switch the optical path in the reference arm, a necessary step to use the device for FSI range measurements.
A chip-scale solid-state wavelength measuring device based on a silicon photonics platform is presented. It has no moving parts and allows single-shot wavelength measurement with high precision over a nominal bandwidth of 40 nm in the Oband. The wavemeter design is based on multimode interferometer (MMI) couplers and a multi-band Mach–Zehnder interferometer (MZI) structure with exponentially increasing optical path differences and in-phase quadrature detection. The design of the MMI couplers is supported by simulations using the Finite-Difference Time-Domain (FDTD) method. The design, experimental evaluation, and calibration of the device are discussed. Observed performance indicates a spectral support of 38.069 nm (i.e., frequency bandwidth 6.608 THz), with a resolution of 8.3 pm (1σ), corresponding to 1 part in 4,587. This wavelength meter approach has emerged from a need in absolute distance measurements using frequency scanning interferometry, where knowledge of the instantaneous wavelength of a tunable laser is required to relate signal frequency with target range. We also present an adaptive delay line on a chip, demonstrate its use for range measurements, and suggest how the wavelength meter could evolve for real-time applications.
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