The contributors to image noise of two computed radiography (CR) detector systems-a state-of-the-art and a wellchosen laboratory CR image plate-were studied by two different methods. Method 1 analyzes the image noise content of a series of images obtained at a wide range of different X-ray exposure levels. It uses a model to fit the observed exposure dependence of the normalized noise power spectrum (NNPS): It distinguishes between an NNPS component that is independent of the exposure level and mainly due to correlated noise, and an NNPS component which is inversely proportional to the exposure level and consists mainly of quantum noise. Method 2 analyzes several images taken at the same exposure level and distinguishes between correlated noise, which remains unchanged in repeated exposures, and uncorrelated noise which is different in each image. The results of the two methods allowed the relevant noise contributions in CR images to be quantitatively determined. The novel laboratory image plate showed a significant reduction of correlated noise with an accompanying increase in the DQE. The results also served to estimate a possible improvement of DQE if an appropriate flat field correction is made for these CR systems.
KEYWORDS: Sensors, Modulation transfer functions, Chromium, X-ray detectors, X-rays, Data modeling, Imaging devices, Signal to noise ratio, Quantum efficiency, Data conversion
The DQEs of four digital X-ray detector systems have been measured in accordance with the new international standard IEC 62220-1: two CR detector systems of the same type, a CsI-based indirect flat panel detector and a selenium-based direct flat panel detector. A mobile measurement set-up complying with IEC 62220-1 has been realized. All equipment used was of a specific design, tested and calibrated. A standardized radiation quality (RQA5) was applied, and the air
kerma at the detector entrance was varied between about 1 μGy and 20 μGy. The measurements of the two CR detector systems were performed at different sites using different X-ray generators/tubes and were in agreement within 0.02. The maximum DQE values were obtained for the lowest spatial frequency for which the DQE is required to be reported according to the IEC standard, i.e. at 0.5 mm-1: The maximum DQE value measured was 0.21 for the CR systems, 0.42 for the indirect flat panel detector, and 0.31 for the direct Selenium-based detector. It has been demonstrated that the
international standard IEC 62220-1 allows accurate and reliable measurements of the DQE to be conducted. It is now possible to objectively measure and compare DQE values of digital X-ray detector systems.
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