Additive manufacturing (AM) of metallic components allows for the fabrication of functional metallic components with complex geometries. During AM, unexpected variations in the process parameters may lead to microscale defects which compromise the product functionality. We investigate the use of phased array and guided wave ultrasonic testing as cost-effective and safe quality assurance techniques to detect typical defects generated in selective laser melting (SLM) components. In a typical SLM process, a powdered material is deposited layer by layer then fused together using a laser source to create the desired part geometry. A variation in the laser power or speed can lead to lack-of-fusion or gas porosity defects which might not be detectable during manufacturing. In this work, typical defects are generated in SLM components with thick and thin geometries by deliberately reducing the laser power below the normal values at prespecified locations of the AM samples. The density and shape of the generated defects are first identified using X-ray computed tomography and optical microscopy. A phased array ultrasonic testing probe is then used for imaging pin shaped defects in thick rectangular components. The defect images are also compared to that obtained from numerical simulations using the finite element method. Partially fused defects down to 0.25 mm diameter are detected using this approach. Additionally, a scanning laser Doppler vibrometer is used to image guided waves generated by piezoelectric transducers bonded to thin SLM components. The guided waves are used to detect powder filled cylindrical defects down to 1 mm in size.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.