Dr. Hongwei Liu Profile

Dr. Hongwei Liu

at Tianjin Univ

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 30 November 2017 Paper

Application of tpmm-technique in cad of millimeter-wave diplexer with e-plane all-metal filters

Hongwei Liu

Proceedings Volume 2250, 22508B (2017) https://doi.org/10.1117/12.2303316

KEYWORDS: Computer aided design, Solid modeling, Microwave engineering, Electronics engineering, V band

Read Abstract +

SPIE Journal Paper | 20 October 2017

Simulation of electrically tunable grating coupler for optical attenuation and spectrum-shift compensation

Zanyun Zhang, Hua Zhu, Zan Zhang, Chuantong Cheng, Hongwei Liu, Beiju Huang, Hongqiang Li, Hongda Chen

OE, Vol. 56, Issue 10, 107107, (October 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.10.107107

KEYWORDS: Signal attenuation, Diodes, Epoxies, Waveguides, Refractive index, Cladding, Silicon, Finite-difference time-domain method, Channel projecting optics, Optical design

Read Abstract +

Proceedings Article | 20 November 2007 Paper

A new golden bump making method for high power LED flip chip

Hongwei Liu, Pingjuan Niu, Haiyang Hu, Hongda Chen, Zhiwei Xia

Proceedings Volume 6828, 682810 (2007) https://doi.org/10.1117/12.760274

KEYWORDS: Light emitting diodes, Gold, Ultrasonics, Electrodes, Metals, Silicon, Electroplating, Scanning electron microscopy, Semiconducting wafers, Packaging

Read Abstract +

Proceedings Article | 31 December 2005 Paper

A new empirical model for heterojunction phototransistors

Hongwei Liu, Pingjuan Niu, Weilian Guo

Proceedings Volume 6037, 603711 (2005) https://doi.org/10.1117/12.638694

KEYWORDS: Phototransistors, Heterojunctions, Instrument modeling, Capacitance, Polonium, Photodiodes, Device simulation, Silicon, Lead, Physics

Read Abstract +

Proceedings Article | 2 April 2004 Paper

Apparent positive resistance and temperature effect on I-V characteristics of RTD

Changyun Miao, Weilan Guo, Ping-Juan Niu, Hongwei Liu, Hong-Qiang Li, Dan Qu, Zhe Xu

Proceedings Volume 5276, (2004) https://doi.org/10.1117/12.522799

KEYWORDS: Resistance, Temperature metrology, Diodes, Bistability, Logic, Field effect transistors, Digital electronics, Lithium, Data transmission, Microwave radiation

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years