Dr. Hsi-Hsuan Yen
at Industrial Technology Research Institute
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 March 2011 Paper
Wen-Yung Yeh, Hsi-Hsuan Yen, Yi-Jen Chan
Proceedings Volume 7939, 793910 (2011) https://doi.org/10.1117/12.873668
KEYWORDS: Light emitting diodes, Semiconducting wafers, Standards development, Gallium nitride, Photography, Safety, Scanning electron microscopy, Diodes, Aluminium gallium indium phosphide, Sapphire

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