Dr. Isabelle Tovena-Pecault Profile

Dr. Isabelle Tovena-Pecault

Director Europe & International at ALPHA-RLH

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Author

Publications (14)

Proceedings Article | 20 June 2024 Poster + Paper

Innovative laser manufacturing processes at nano scale within the NewSkin Open Innovation Test Bed

Rubye Zehani, Isabelle Tovena Pecault, Girolamo Mincuzzi, Abhijit Cholkar, Suman Chatterjee, David Kinahan, Dermot Brabazon

Proceedings Volume 13005, 130050W (2024) https://doi.org/10.1117/12.3021847

KEYWORDS: Laser processing, Laser manufacturing, Nanotechnology, Manufacturing, Ultrafast lasers, Surface properties, Optical surfaces, Femtosecond phenomena

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SPIE Journal Paper | 24 November 2017

Volatile organic compound and semivolatile organic compound outgassing rates for ethylene propylene diene monomer and fluoropolymer seals

Isabelle Tovena Pecault

OE, Vol. 56, Issue 11, 115108, (November 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.11.115108

KEYWORDS: Molecules, Contamination, Pollution control, Optical engineering, Laser optics, Natural surfaces, High power lasers, Adsorption, Semiconducting wafers, Laser induced damage

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Proceedings Article | 31 October 2014 Paper

Influence of organic contamination on laser induced damage of multilayer dielectric mirrors by subpicosecond laser pulses

O. Favrat, M. Sozet, I. Tovena-Pécault, L. Lamaignère, J. Néauport

Proceedings Volume 9237, 923707 (2014) https://doi.org/10.1117/12.2067902

KEYWORDS: Contamination, Mirrors, Laser induced damage, Dielectric mirrors, Laser damage threshold, Optical components, Natural surfaces, Laser development, Laser optics, Molecules

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Proceedings Article | 4 December 2012 Paper

Study of the LIDT degradation of optical components by intentional organic contamination

B. Mangote, I. Tovena-Pecault, J. Néauport

Proceedings Volume 8530, 853025 (2012) https://doi.org/10.1117/12.968573

KEYWORDS: Contamination, Ions, Laser induced damage, Coating, Optical components, Statistical analysis, Molecules, Silica, Thermography, Packaging

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Proceedings Article | 31 December 2009 Paper

Impact of outgassing organic contamination on laser induced damage of optics

K. Bien-Aimé, A. Pereira, C. Belin, L. Gallais, P. Grua, I. Tovena-Pecault, J. Néauport, E. Fargin

Proceedings Volume 7504, 75040V (2009) https://doi.org/10.1117/12.836384

KEYWORDS: Contamination, Laser induced damage, Silica, Molecules, Liquids, Molecular lasers, Optical components, Optics manufacturing, Polishing, Laser damage threshold

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Proceedings Article | 18 January 2007 Paper

Influence of artificial metallic defects size on the surface cleaning process

J. Capoulade, J. Natoli, S. Palmier, J. Rullier, I. Tovena

Proceedings Volume 6403, 64030G (2007) https://doi.org/10.1117/12.695454

KEYWORDS: Absorption, Aluminum, Silica, Particles, Laser induced damage, Microscopes, Profilometers, Laser optics, Nd:YAG lasers, Microscopy

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Proceedings Article | 18 January 2007 Paper

Surface particulate contamination of the LIL optical components and their evolution under laser irradiation

S. Palmier, S. Garcia, L. Lamaignère, M. Loiseau, T. Donval, J. Rullier, I. Tovena, L. Servant

Proceedings Volume 6403, 64030V (2007) https://doi.org/10.1117/12.695442

KEYWORDS: Particles, Silica, Optical components, Antireflective coatings, Pollution, Minerals, Contamination, Laser irradiation, Scanning electron microscopy, Laser induced damage

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Proceedings Article | 15 January 2007 Paper

Impact of organic contamination on 1064-nm laser-induced damage threshold of dielectric mirrors

A. Pereira, J.-G. Coutard, S. Becker, I. Tovena, P. Bouchut, G. Ravel

Proceedings Volume 6403, 64030I (2007) https://doi.org/10.1117/12.696037

KEYWORDS: Molecules, Mirrors, Contamination, Laser induced damage, Dielectric mirrors, Laser damage threshold, Optical components, Quartz, Laser irradiation, Hybrid fiber optics

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Proceedings Article | 28 April 2006 Paper

Characterization of particle contamination for optical application

I. Tovena, S. Palmier, S. Garcia, P. Manac'h, E. Sellier

Proceedings Volume 6188, 61881H (2006) https://doi.org/10.1117/12.661621

KEYWORDS: Particles, Particle contamination, Silica, Scanning electron microscopy, Optical filters, Control systems, Silicon, Particle filters, Gold, Contamination control

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Proceedings Article | 7 February 2006 Paper

Impact of outgassing organic contamination on laser-induced damage threshold of optics: effect of laser conditioning

G. Guéhenneux, Ph. Bouchut, M. Veillerot, A. Pereira, I. Tovena

Proceedings Volume 5991, 59910F (2006) https://doi.org/10.1117/12.638161

KEYWORDS: Mirrors, Contamination, Laser damage threshold, Laser induced damage, Natural surfaces, Laser optics, Raster graphics, Adhesives, Aluminum, Optical components

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Proceedings Article | 7 February 2006 Paper

Propagation of LIL/LMJ beams under the interaction with contamination particles

S. Mainguy, I. Tovena-Pécault, B. Le Garrec

Proceedings Volume 5991, 59910G (2006) https://doi.org/10.1117/12.638566

KEYWORDS: Particles, Dielectrics, Silica, Contamination, Pollution, Diffraction, Laser beam propagation, Kerr effect, Optical components, Numerical simulations

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Proceedings Article | 7 February 2006 Paper

Study of laser interaction with aluminum contaminant on fused silica

S. Palmier, I. Tovena, L. Lamaignère, J.L. Rullier, J. Capoulade, B. Bertussi, J.Y. Natoli, L. Servant

Proceedings Volume 5991, 59910R (2006) https://doi.org/10.1117/12.639141

KEYWORDS: Aluminum, Silica, Absorption, Microscopy, Laser induced damage, Optical lithography, Microscopes, High power lasers, Contamination, Particles

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Proceedings Article | 21 February 2005 Paper

Evaluation of outgassing contamination effects on optical surfaces of the LIL

Gaëlle Guehenneux, Marc Veillerot, Isabelle Tovena, Philippe Bouchut, Laurence Delrive

Proceedings Volume 5647, (2005) https://doi.org/10.1117/12.585229

KEYWORDS: Contamination, Mirrors, Laser damage threshold, Silicon, Laser induced damage, Magnetoencephalography, Chemical species, Laser optics, Optical lithography, Natural surfaces

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Proceedings Article | 21 February 2005 Paper

Laser damaged optics induced by chromium particle contamination

Stephanie Palmier, Isabelle Tovena, Roger Courchinoux, Michel Josse, Jean Luc Rullier, Bertrand Bertussi, Jean Yves Natoli, Laurent Servant, David Talaga

Proceedings Volume 5647, (2005) https://doi.org/10.1117/12.585248

KEYWORDS: Chromium, Silica, Absorption, Contamination, Laser induced damage, Atomic force microscopy, Particles, Laser optics, Optical components, Microscopes

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Showing 5 of 14 publications

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