Dr. Jack Liddle
Imaging Scientist
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 29 August 2019 Paper
Proceedings Volume 11177, 111770I (2019) https://doi.org/10.1117/12.2536329
KEYWORDS: Lithography, Extreme ultraviolet, Projection systems, Diffraction, Extreme ultraviolet lithography, Scanners, EUV optics, Lithographic illumination, Projection lithography, Optical imaging, Computational lithography

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