Dr. Jae Hong Park
Senior Researcher at National Nanofab Ctr
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 1 April 2016 Paper
Jae Hong Park, Hyun Ik Jang, Woo Choong Kim, Hae Yun, Jun Yong Park, Seok Woo Jeon, Hee Yeoun Kim, Chi Won Ahn
Proceedings Volume 9777, 977723 (2016) https://doi.org/10.1117/12.2205065
KEYWORDS: Nanostructures, Silicon, Polymers, Electron beam lithography, Lithography, Polymeric sensors, Polymeric actuators, Electro optic polymers, Solar energy, Process engineering, Nickel, Platinum, Nanolithography

Proceedings Article | 19 March 2015 Paper
Jae Hong Park, Hyun Ik Jang, Jun Yong Park, Seok Woo Jeon, Woo Choong Kim, Hee Yeoun Kim, Chi Won Ahn
Proceedings Volume 9423, 94231N (2015) https://doi.org/10.1117/12.2080980
KEYWORDS: Silicon, Nanostructures, Nickel, Lithography, Platinum, Polymers, Nanolithography, Infrared lenses, Infrared radiation, Lenses

Proceedings Article | 19 June 2013 Paper
Hee Yeoun Kim, Chungmo Yang, Jae Hong Park, Ho Jung, Taehyun Kim, Kyung Tae Kim, Sung Kyu Lim, Sang Woo Lee, Jay Mitchell, Wook Joong Hwang, Kwyro Lee
Proceedings Volume 8704, 87043E (2013) https://doi.org/10.1117/12.2015738
KEYWORDS: Semiconducting wafers, Microbolometers, Sensors, Resistance, Packaging, Reliability, Wafer bonding, Wafer testing, Wafer-level optics, Amorphous silicon

Proceedings Article | 31 May 2012 Paper
Myeongho Song, Tae Hyun Kim, Moon Seop Hyun, Jae Hong Park, Hee Yeoun Kim, Gawon Lee
Proceedings Volume 8353, 83532B (2012) https://doi.org/10.1117/12.918982
KEYWORDS: Silicon, Transmittance, Semiconducting wafers, Infrared sensors, Sensors, Absorption, Oxygen, Packaging, Microelectromechanical systems, Germanium

Proceedings Article | 31 May 2012 Paper
Taehyun Kim, Kimyung Kyung, Jae Hong Park, Young Su Kim, Sung Kyu Lim, Kyungmin Kim, Kwyro Lee, C. Welham, Hee Yeoun Kim
Proceedings Volume 8353, 83531B (2012) https://doi.org/10.1117/12.918916
KEYWORDS: Microbolometers, Readout integrated circuits, Sensors, Thermography, Resistance, Capacitance, Semiconducting wafers, Materials processing, Amorphous silicon, Infrared imaging

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