Dr. James A. Gregory
at MIT Lincoln Lab
SPIE Involvement:
Author
Publications (20)

SPIE Journal Paper | 30 September 2024 Open Access
JATIS, Vol. 11, Issue 01, 011004, (September 2024) https://doi.org/10.1117/12.10.1117/1.JATIS.11.1.011004
KEYWORDS: Diffraction gratings, X-rays, Optical gratings, Computed tomography, Blazed gratings, Spectroscopy, Diffraction, Silicon, Equipment, X-ray telescopes

Proceedings Article | 21 August 2024 Poster + Paper
Eric Miller, James Gregory, Marshall Bautz, Harry Clark, Michael Cooper, Kevan Donlon, Richard Foster, Catherine Grant, Mallory Jensen, Beverly LaMarr, Renee Lambert, Christopher Leitz, Andrew Malonis, Mo Neak, Gregory Prigozhin, Kevin Ryu, Benjamin Schneider, Keith Warner, Douglas Young, William Zhang
Proceedings Volume 13093, 130935P (2024) https://doi.org/10.1117/12.3018475
KEYWORDS: Charge-coupled devices, Semiconducting wafers, Silicon, Sensors, X-rays, Wafer bonding, Vacuum, CCD image sensors, Deformation, X-ray detectors

Proceedings Article | 23 August 2021 Presentation + Paper
Ralf Heilmann, Alexander Bruccoleri, Jungki Song, Bethany Levenson, Brian Smallshaw, Mallory Whalen, Alan Garner, Sarah Trowbridge Heine, Herman Marshall, Matthew Cook, James Gregory, Renee Lambert, Dmitri Shapiro, Douglas Young, Eric Gullikson, Tomoyuki Nonaka, Akimi Uchida, Manuel Quijada, Ed Hertz, Peter Cheimets, Randall Smith, Mark Schattenburg
Proceedings Volume 11822, 1182215 (2021) https://doi.org/10.1117/12.2594951
KEYWORDS: Diffraction gratings, Computed tomography, Semiconducting wafers, X-rays, Diffraction, Etching, Deep reactive ion etching, Photomasks, Optical alignment, X-ray diffraction

Proceedings Article | 13 December 2020 Presentation + Paper
Proceedings Volume 11444, 114441H (2020) https://doi.org/10.1117/12.2562388
KEYWORDS: Diffraction gratings, X-rays, Manufacturing, Spectroscopy, Computed tomography, Diffraction, Absorption, Emission spectroscopy, Diagnostics, Plasmas

Proceedings Article | 6 July 2018 Paper
K. Ryu, C. Leitz, H. Clark, X. Chen, M. Cooper, M. Zhu, P. Welander, R. Lambert, V. Bolkhovsky, D.-R. Yost, B. Burke, J. Gregory, V. Suntharalingam
Proceedings Volume 10699, 106993P (2018) https://doi.org/10.1117/12.2311512
KEYWORDS: Semiconducting wafers, Charge-coupled devices, Hydrogen, Oxides, Silicon, Quantum efficiency, Wafer bonding, Ultraviolet radiation, Interfaces, Plasma enhanced chemical vapor deposition, Molecular beam epitaxy

Showing 5 of 20 publications
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