Mr. Jeremie Klein Profile

Jeremie Klein

at CEA-VALDUC

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Proceedings Article | 4 February 2013 Paper

Qualification process of CR system and quantification of digital image quality

P. Garnier, L. Hun, J. Klein, C. Lemerle

Proceedings Volume 8653, 86530S (2013) https://doi.org/10.1117/12.2001660

KEYWORDS: Image processing, Silver, Image quality, X-rays, Radiography, Inspection, Scanners, Chromium, Digital image processing, Absorbance

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CEA Valduc uses several X-Ray generators to carry out many inspections: void search, welding expertise, gap measurements, etc. Most of these inspections are carried out on silver based plates. For several years, the CEA/Valduc has decided to qualify new devices such as digital plates or CCD/flat panel plates. On one hand, the choice of this technological orientation is to forecast the assumed and eventual disappearance of silver based plates; on the other hand, it is also to keep our skills mastering up-to-date. The main improvement brought by numerical plates is the continuous progress of the measurement accuracy, especially with image data processing. It is now common to measure defects thickness or depth position within a part. In such applications, data image processing is used to obtain complementary information compared to scanned silver based plates. This scanning procedure is harmful for measurements which imply a data corruption of the resolution, the adding of numerical noise and is time expensive. Digital plates enable to suppress the scanning procedure and to increase resolution. It is nonetheless difficult to define, for digital images, single criteria for the image quality. A procedure has to be defined in order to estimate quality of the digital data itself; the impact of the scanning device and the configuration parameters are also to be taken into account. This presentation deals with the qualification process developed by CEA/Valduc for digital plates (DUR-NDT) based on the study of quantitative criteria chosen to define a direct numerical image quality that could be compared with scanned silver based pictures and the classical optical density. The versatility of the X-Ray parameters is also discussed (X-ray tension, intensity, time exposure). The aim is to be able to transfer the year long experience of CEA/Valduc with silver-based plates inspection to these new digital plates supports. This is an industrial stake.

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