Dr. Jeremy A. Theil
at Xperi
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 24 November 2003 Paper
Sandeep Kohli, Jeremy Theil, Rick Snyder, Christopher Rithner, Peter Dorhout
Proceedings Volume 5224, (2003) https://doi.org/10.1117/12.501706
KEYWORDS: Silicon, Silicon films, Nanocrystals, Crystals, Annealing, Temperature metrology, Oxides, Thermal oxidation, Nitrogen, Oxidation

Proceedings Article | 26 December 2001 Paper
Jeremy Theil, Homayoon Haddad, Rick Snyder, Mike Zelman, David Hula, Kirk Lindahl
Proceedings Volume 4435, (2001) https://doi.org/10.1117/12.451149
KEYWORDS: Photodiodes, Sensors, Diodes, CMOS technology, CMOS sensors, Transparent conductors, Imaging systems, Image sensors, Quantum efficiency, Active sensors

Proceedings Article | 2 February 2001 Paper
Howard Abraham, Homer Antoniadis, Daniel Roitman, Kyle Frischknecht, Travis Blalock, Ken Nishimura, Thomas Knotts, Jeremy Theil, Chris Bright, Jeffrey Miller, Ronald Moon
Proceedings Volume 4105, (2001) https://doi.org/10.1117/12.416915
KEYWORDS: Polymers, Silicon, LCDs, Analog electronics, Organic light emitting diodes, Video, Integrated circuits, Semiconducting wafers, Molecules, Switches

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