This study continues examining the topological dependence of diffuse reflectance for NIR-SWIR absorbing dyes on substrates. The dependence is examined by case studies using composite-material layers that include IR absorbing dyes on fabric substrates. Understanding the topological dependence of diffuse reflectance can assist in determining optimal composite-material configurations for specific reflectance specifications, which can include UV protecting materials.
This report continues presentation of case studies for inverse spectral analysis and parametric modeling of diffuse reflectance spectra for NIR-SWIR absorbing dyes. These case studies demonstrate the concept of applying inverse spectral analysis to diffuse reflectance, for estimation of absorbance functions, and parametric modeling for simulation of diffuse reflectance. Sufficient sensitivity of absorption spectra relative to inverse spectral analysis establishes that estimated absorbance functions can be used for parametric modeling of reflectance from dye formulations on substrates, e.g., fabrics.
This study examines topological dependence of diffuse reflectance for IR absorbing materials. A theoretical foundation for this functional dependence is described, elucidating physical processes underlying topological dependence of IR diffuse reflectance of composite-material layers on substrates. The dependence is examined by case studies using composite-material layers that include IR absorbing dyes on fabric substrates. Understanding the topological dependence of diffuse reflectance can assist in determining optimal composite-material configurations for specific reflectance specifications, which can include UV protecting materials.
This study describes case studies for inverse spectral analysis and parametric modeling of diffuse reflectance spectra for NIR-SWIR absorbing dyes. These case studies demonstrate the concept of applying inverse spectral analysis to diffuse reflectance, for estimation of absorbance functions, and parametric modeling for simulation of diffuse reflectance. Sufficient sensitivity of absorption spectra relative to inverse spectral analysis establishes that estimated absorbance functions can be used for parametric modeling of reflectance from dye formulations on substrates, e.g., fabrics.
Case studies are presented for sensitivity analysis of absorption spectra, which are for IR absorbing dyes relative to inverse analysis of measured spectra. Inverse analysis of reflectance is based on diffuse-reflectance theory, scattering theory, and effective medium models of mixtures and deposit-on-substrate structure. Absorption spectra obtained by inverse spectral analysis provide information for estimating dielectric response functions. Sufficient sensitivity of absorption spectra relative to inverse spectral analysis implies that estimated dielectric response functions can be used for the construction of approximate effective medium models capable of estimating reflectance from dye formulations on substrates, e.g., fabrics, supporting the modeling and prediction of dielectric responses. Prototype systems considered for case-study analysis are NIR-SWIR absorbing dyes on substrates.
This study describes parametric modeling and prototype simulations using absorption spectra for NIR-SWIR absorbing dyes, which are obtained by inverse analysis of diffuse-reflectance spectra. Absorption spectra of NIR/SWIR-absorbing dyes obtained by inverse spectral analysis provides information for estimating their dielectric response functions. Sufficient sensitivity of absorption spectra relative to inverse spectral analysis implies that estimated dielectric response functions can be used for estimating reflectance from dye formulations on substrates, e.g., fabrics.
This study describes a sensitivity analysis of absorption spectra for NIR-SWIR absorbing dyes relative to inverse analysis of diffuse-reflectance spectra. Absorption spectra of NIR/SWIR-absorbing dyes obtained by inverse spectral analysis provides information for estimating their dielectric response functions. Sufficient sensitivity of absorption spectra relative to inverse spectral analysis implies that estimated dielectric response functions can be used for construction of approximate effective medium models capable of estimating reflectance from dye formulations on substrates, e.g., fabrics. The specific concept of applying inverse spectral analysis to diffuse reflectance, measured with field spectrometers, for estimation of dielectric response, is considered here.
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