Ms. JiHye Lee Profile

JiHye Lee

at SAMSUNG Electronics Co., Ltd.

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Author

Publications (2)

Proceedings Article | 13 November 2024 Presentation

Massive on-cell overlay metrology solution based on Mueller-matrix analysis for advanced process control

Changhyeong Yoon, Hyukjoon Cho, Ji Yong Shin, Kihun Kang, Juntaek Oh, Donggun Lee, Jaehyun Son, Seunga Lim, Eunsoo Hwang, Jinsoo Lee, ByeongKi Kang, Jaewon Lee, Jinwoo Ahn, Taeyong Jo, Jungho Ahn, Jihye Lee, Seulki Kim, Kyunghoon Park, JangKyu Lee, Heedong Kwak, Younghoon Sohn, Yusin Yang, Myungjun Lee

Proceedings Volume PC13215, PC132150B (2024) https://doi.org/10.1117/12.3032695

KEYWORDS: Overlay metrology, Advanced process control, Metrology, Semiconductors, Imaging systems, Ellipsometry, Time metrology, Semiconductor manufacturing, Semiconducting wafers, Scanning electron microscopy

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Proceedings Article | 10 April 2024 Presentation + Paper

On-cell thickness monitoring of chalcogenide alloy layer using spectral interferometry, Raman spectroscopy, and hybrid machine learning

Hyunwoo Ryoo, Seul Ji Song, Min Ji Jeon, Juhyun Moon, JiHye Lee, ByungHyun Hwang, Jeongho Ahn, Yoon-jong Song, Hidong Kwak, Lior Neeman, Noga Meir, Jaehong Jang, Ik Hwan Kim, Hyunkyu Kim

Proceedings Volume 12955, 129550G (2024) https://doi.org/10.1117/12.3012496

KEYWORDS: Raman spectroscopy, Transmission electron microscopy, Interferometry, Semiconducting wafers, Signal intensity, Machine learning, Film thickness, Diffractive optical elements, Chalcogenides, Calibration

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