Jia-Wei Li
at National Taipei Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2024 Poster + Paper
Proceedings Volume 12955, 129552J (2024) https://doi.org/10.1117/12.3010132
KEYWORDS: Finite-difference time-domain method, Reflectivity, Artificial neural networks, Simulations, Reflection, Critical dimension metrology, Modeling, Electromagnetic simulation, Education and training, Spectral data processing

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