Job van der Laken
at Hague Univ of Applied Sciences
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 March 2024 Presentation
Steven van den Berg, Job van der Laken, Hedde Van Hoorn, Naomi van der Kolk
Proceedings Volume PC12879, PC1287905 (2024) https://doi.org/10.1117/12.3000344
KEYWORDS: Optical testing, Head, Detector arrays, Beam diameter, Algorithm development, Portability, Measurement uncertainty, Machine learning, Laser development, Equipment

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