Dr. Joern Schwandt Profile

Dr. Joern Schwandt

at Univ of Hamburg

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Author

Publications (3)

Proceedings Article | 20 February 2017 Paper

AGIPD: a multi megapixel, multi megahertz X-ray camera for the European XFEL

Ulrich Trunk, A. Allahgholi, J. Becker, A. Delfs, R. Dinapoli, P. Göttlicher, H. Graafsma, D. Greiffenberg, H. Hirsemann, S. Jack, A. Klyuev, H. Krueger, S. Lange, T. Laurus, A. Marras, D. Mezza, A. Mozzanica, J. Poehlsen, S. Rah, B. Schmitt, J. Schwandt, I. Sheviakov, X. Shi, Q. Xia, J. Zhang, M. Zimmer

Proceedings Volume 10328, 1032805 (2017) https://doi.org/10.1117/12.2269153

KEYWORDS: Sensors, Photons, Single photon, X-rays, Image storage, Amplifiers, Free electron lasers, Diffraction, Cameras, Multiplexers

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Proceedings Article | 3 May 2013 Paper

The AGIPD System for the European XFEL

Laura Bianco, J. Becker, R.D. Dinapoli, E. Fretwurst, P. Goettlicher, H. Graafsma, D. Greiffenberg, M. Gronewald, B. Henrich, H. Hirsemann, S. Jack, R. Klanner, A. Klyuev, H. Krueger, A. Marras, A. Mozzanica, S. Rah, B. Schmitt, X. Shi, U. Trunk, J. Schwandt, J. Zhang

Proceedings Volume 8778, 87780V (2013) https://doi.org/10.1117/12.2017360

KEYWORDS: Sensors, X-rays, Calibration, Image storage, Photons, Single photon, Amplifiers, Silicon, Gain switching, Analog electronics

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Proceedings Article | 3 May 2013 Paper

Study of high-dose x-ray radiation damage of silicon sensors

Joern Schwandt, Eckhart Fretwurst, Robert Klanner, Ioana Pintilie, Jiaguo Zhang

Proceedings Volume 8777, 87770K (2013) https://doi.org/10.1117/12.2019514

KEYWORDS: Sensors, X-rays, Silica, Oxides, Silicon, Annealing, Interfaces, Metals, Diodes, Nitrous oxide

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