Prof. John C. Howell
at Chapman Univ
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 13 March 2024 Presentation
Proceedings Volume PC12912, PC129121O (2024) https://doi.org/10.1117/12.3012338

Proceedings Article | 9 March 2023 Presentation
Proceedings Volume PC12447, PC124470K (2023) https://doi.org/10.1117/12.2657173

Proceedings Article | 9 March 2023 Presentation
Proceedings Volume PC12447, PC124472Z (2023) https://doi.org/10.1117/12.2655800
KEYWORDS: Gyroscopes, Doppler effect, Phase measurement, Sagnac interferometers, Phase interferometry, Metrology, Interferometry

Proceedings Article | 30 September 2016 Presentation + Paper
Proceedings Volume 9948, 99480O (2016) https://doi.org/10.1117/12.2242915
KEYWORDS: Cameras, Spatial resolution, Optical signal processing, Geometrical optics, Sensors, Eye, Visible radiation, Integral imaging, 3D displays, Metamaterials

Proceedings Article | 21 May 2015 Paper
James Schneeloch, Samuel Knarr, Gregory Howland, John Howell
Proceedings Volume 9500, 95000T (2015) https://doi.org/10.1117/12.2177296
KEYWORDS: Quantum information, Particles, Neodymium, Sensors, Nonlinear crystals, Quantum cryptography, Information theory, Photodetectors, Physics, Astronomy

Showing 5 of 8 publications
Conference Committee Involvement (14)
Optical and Quantum Sensing and Precision Metrology
6 March 2021 | Online Only, California, United States
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
1 February 2020 | San Francisco, California, United States
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
2 February 2019 | San Francisco, California, United States
Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
29 January 2018 | San Francisco, California, United States
Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
30 January 2017 | San Francisco, California, United States
Showing 5 of 14 Conference Committees
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