Jonathan J. Bernstein
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 17 February 2010 Paper
Jonathan Varsanik, William Teynor, John LeBlanc, Heather Clark, Jeffrey Krogmeier, Tian Yang, Kenneth Crozier, Jonathan Bernstein
Proceedings Volume 7577, 75770Q (2010) https://doi.org/10.1117/12.841165
KEYWORDS: Waveguides, Plasmonics, Glasses, Semiconducting wafers, Resonators, Microfluidics, Light scattering, Metals, Plasmons, Aluminum

Proceedings Article | 12 February 2007 Paper
Jonathan Bernstein, Tom Lee, Fran Rogomentich, Mirela Bancu, Ki Kim, Gopi Maguluri, Brett Bouma, Johannes DeBoer
Proceedings Volume 6432, 64320L (2007) https://doi.org/10.1117/12.701266
KEYWORDS: Mirrors, Microelectromechanical systems, Endoscopes, Optical coherence tomography, Scanners, Micromirrors, Magnetism, Semiconducting wafers, Etching, Raster graphics

Proceedings Article | 15 January 2003 Paper
Juikun Lee, Heinz Busta, Ronald Myers, Tina Dear, Mehmet Dokmeci, Jonathan Bernstein
Proceedings Volume 4979, (2003) https://doi.org/10.1117/12.478290
KEYWORDS: Chemical mechanical planarization, Polishing, Etching, Semiconducting wafers, Photomasks, Microelectromechanical systems, Microopto electromechanical systems, Silicon, Standards development, Surface finishing

Proceedings Article | 5 September 1997 Paper
Proceedings Volume 3223, (1997) https://doi.org/10.1117/12.284500
KEYWORDS: Silicon, Capacitance, Amplifiers, Ultrasonography, Field effect transistors, Hybrid circuits, Chemical vapor deposition, Plasma enhanced chemical vapor deposition, Semiconducting wafers, Transistors

Proceedings Article | 23 September 1996 Paper
Marc Weinberg, Jonathan Bernstein, Jeffrey Borenstein, J. Campbell, J. Cousens, Robert Cunningham, R. Fields, Paul Greiff, Brenda Hugh, Les Niles, Jerome Sohn
Proceedings Volume 2879, (1996) https://doi.org/10.1117/12.251201
KEYWORDS: Silicon, Gyroscopes, Sensors, Semiconducting wafers, Glasses, Micromachining, Etching, Reactive ion etching, Electronics, Scanning electron microscopy

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