Jonathan Q. Li
at Agilent Technologies Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 February 2006 Paper
Proceedings Volume 6070, 607002 (2006) https://doi.org/10.1117/12.643444
KEYWORDS: Machine vision, Scene classification, Error analysis, Manufacturing, Inspection, Lithium, Roads, Machine learning, Classification systems, Image classification

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