Prof. Jonghan Jin Profile

Prof. Jonghan Jin

Principal Research Scientist / Professor at Korea Research Institute of Standards and Science

SPIE Involvement:

Conference Program Committee | Author

Publications (18)

Proceedings Article | 30 September 2024 Presentation + Paper

Study on phase measurement uncertainty according to the number of phase shifting steps in a multiwavelength interferometer directly using optical comb modes

J. Park, Y.-S. Jang, J. Jin

Proceedings Volume 13134, 1313406 (2024) https://doi.org/10.1117/12.3026862

KEYWORDS: Phase shifting, Phase measurement, Measurement uncertainty, Model based design, Interferometers, Data modeling, Distance measurement, Signal intensity

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Proceedings Article | 30 September 2024 Presentation + Paper

Absolute distance measurement using individual frequency modes of the electro-optic comb based on multiwavelength interferometry

Jonghan Jin, Jungjae Park, Yoon-soo Jang

Proceedings Volume 13134, 1313405 (2024) https://doi.org/10.1117/12.3025565

KEYWORDS: Interferometers, Distance measurement, Laser interferometry, Optical interferometry, Measurement uncertainty

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Proceedings Article | 10 April 2024 Poster + Paper

Thin film thickness analysis based on a deep learning algorithm using data augmentation

Joonyoung Lee, Jonghan Jin

Proceedings Volume 12955, 129552G (2024) https://doi.org/10.1117/12.3010091

KEYWORDS: Film thickness, Thin films, Deep learning, Measurement uncertainty, Artificial neural networks, Reflectometry

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Proceedings Article | 15 August 2023 Poster + Paper

Thickness analysis of double-layered thin-film sample using spectral reflectometry

J. Park, J. Bae, Y.-S. Jang, J. Jin

Proceedings Volume 12618, 1261826 (2023) https://doi.org/10.1117/12.2673343

KEYWORDS: Thin films, Film thickness, Multilayers, Reflectivity, Reflectometry, Silicon, Model-based design, Reflection

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Proceedings Article | 15 August 2023 Presentation + Paper

Thin-film thickness measurement based on spectral reflectometer using artificial neural network algorithm

Jonghan Jin, Joonyoung Lee

Proceedings Volume 12618, 1261804 (2023) https://doi.org/10.1117/12.2673342

KEYWORDS: Film thickness, Artificial neural networks, Thin films, Evolutionary algorithms, Reflectometry, Measurement uncertainty, Reflection, Education and training, Reflectivity, Spectroscopy

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Proceedings Article | 3 October 2022 Presentation + Paper

An interferometric method for simultaneous measurement of thickness, refractive index, and surface profile of a silicon wafer

Jungjae Park, Jaeseok Bae, Jonghan Jin

Proceedings Volume 12221, 122210R (2022) https://doi.org/10.1117/12.2632346

KEYWORDS: Refractive index, Semiconducting wafers, Silicon, Interferometers, Wafer-level optics, Optical testing, Mirrors, Integrated optics, Beam splitters, Statistical analysis

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Proceedings Article | 3 October 2022 Presentation + Paper

Absolute distance measurement using polarization-based spectral-domain interferometer with dual reference path

Jonghan Jin, Yeongjun Kim, Heulbi Ahn, Jungjae Park

Proceedings Volume 12221, 122210Q (2022) https://doi.org/10.1117/12.2632344

KEYWORDS: Mirrors, Interferometers, Distance measurement, Polarization, Beam splitters, Light sources, Spectroscopy, Surface plasmons, Reflectivity, Numerical simulations

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Proceedings Article | 21 June 2019 Paper

Precise thickness measurement and comparison of step-shaped microfluidic channel mold using optical interferometry

Jungjae Park, Jaeseok Bae, Jonghan Jin

Proceedings Volume 11056, 110561R (2019) https://doi.org/10.1117/12.2525970

KEYWORDS: Refractive index, Silicon, Semiconducting wafers, Microfluidics, Interferometers, Optical interferometry, Profilometers, Optical testing

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Proceedings Article | 21 June 2019 Paper

Analysis of measurement error caused by swing motion for determining the physical thickness and group refractive index of a large glass panel

Jonghan Jin, Jaeseok Bae, Jungjae Park

Proceedings Volume 11056, 1105604 (2019) https://doi.org/10.1117/12.2525670

KEYWORDS: Glasses, Refractive index, Error analysis, Interferometers, Motion measurement, Light sources, Optical interferometry, Motion analysis, Inspection, Mathematical modeling

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Proceedings Article | 28 May 2014 Paper

Dimensional metrology on a semiconductor packaging process using an optical comb

Jungjae Park, Jonghan Jin, Saerom Maeng

Proceedings Volume 9110, 91100O (2014) https://doi.org/10.1117/12.2049522

KEYWORDS: Semiconducting wafers, Silicon, Wafer-level optics, Interferometers, Semiconductors, Packaging, Geometrical optics, Metrology, Light sources, Spectroscopy

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Proceedings Article | 5 June 2013 Paper

Uncertainty evaluation of the geometrical thickness and refractive index of silicon wafers

Jonghan Jin, Jungjae Park, Jae Wan Kim, Jong-Ahn Kim, Chu-Shik Kang

Proceedings Volume 8706, 87060W (2013) https://doi.org/10.1117/12.2014800

KEYWORDS: Semiconducting wafers, Silicon, Refractive index, Wafer-level optics, Geometrical optics, Fourier transforms, Light sources, Pulsed laser operation, Spectroscopy, Femtosecond phenomena

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Proceedings Article | 5 June 2013 Paper

Simultaneous measurement of the thickness profile and refractive index distribution of silicon wafers

Jungjae Park, Jonghan Jin, Jae Wan Kim, Chu-Shik Kang, Jong-Ahn Kim

Proceedings Volume 8706, 87060V (2013) https://doi.org/10.1117/12.2014799

KEYWORDS: Refractive index, Semiconducting wafers, Silicon, Pulsed laser operation, Femtosecond phenomena, Wafer-level optics, Phase measurement, Reliability, Semiconductor lasers, Light sources

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Proceedings Article | 14 May 2012 Paper

A modified ladar system with a Geiger mode APD to remove a dead time problem

Sung Eun Jo, Hong Jin Kong, Tae Hoon Kim, Jonghan Jin, Jae Wan Kim, Jong-Ahn Kim

Proceedings Volume 8379, 83791A (2012) https://doi.org/10.1117/12.920522

KEYWORDS: LIDAR, Signal detection, Avalanche photodetectors, Avalanche photodiodes, Sensors, Distance measurement, Light sources, Photodiodes, Time metrology, Standards development

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Proceedings Article | 14 May 2010 Paper

One-shot measurement of surface profile using an astigmatic microscope system

C.-S. Kang, J.-U. Lee, J. W. Kim, J.-A. Kim, J. Jin, T. B. Eom

Proceedings Volume 7718, 77180X (2010) https://doi.org/10.1117/12.854124

KEYWORDS: Point spread functions, 3D metrology, Cylindrical lenses, Optical components, Sensors, Cerium, Microscopes, Computer simulations, Monochromatic aberrations, Calibration

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Proceedings Article | 3 September 2009 Open Access

High harmonics generation by plasmonic field enhancement

Seung-Woo Kim, Seungchul Kim, In-Yong Park, Jonghan Jin

Proceedings Volume 7394, 73940U (2009) https://doi.org/10.1117/12.826645

KEYWORDS: Nanostructures, High harmonic generation, Femtosecond phenomena, Surface plasmons, Nanolithography, Xenon, Plasmonics, Argon, Near field, Pulsed laser operation

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Proceedings Article | 3 September 2009 Paper

Design of nanostructures for high harmonic generation by localized surface plasmon resonance

In-Yong Park, Seungchul Kim, Joonhee Choi, Jonghan Jin, Seung-Woo Kim

Proceedings Volume 7394, 73940V (2009) https://doi.org/10.1117/12.826776

KEYWORDS: Nanostructures, Finite-difference time-domain method, Nanolithography, High harmonic generation, Femtosecond phenomena, Signal detection, Surface plasmons, Extreme ultraviolet, Metals, Electronic filtering

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Proceedings Article | 14 August 2006 Paper

Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser

Jonghan Jin, Young-Jin Kim, Yunseok Kim, Chu-Shik Kang, Seung-Woo Kim

Proceedings Volume 6292, 62920O (2006) https://doi.org/10.1117/12.678448

KEYWORDS: Calibration, Femtosecond phenomena, Interferometers, Rubidium, Interferometry, Pulsed laser operation, Laser stabilization, Clocks, Laser optics, Barium

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Proceedings Article | 27 August 2005 Paper

Absolute distance measurement using femtosecond laser

Seung-Woo Kim, Ki-Nam Joo, Jonghan Jin, Yun Seok Kim

Proceedings Volume 5858, 58580N (2005) https://doi.org/10.1117/12.612238

KEYWORDS: Femtosecond phenomena, Distance measurement, Interferometry, Heterodyning, Spectroscopy, Mirrors, Interferometers, Fabry–Perot interferometers, Mode locking, Pulsed laser operation

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Showing 5 of 18 publications

Conference Committee Involvement (3)

Optical Manufacturing and Testing 2024

20 August 2024 | San Diego, California, United States

Optical Manufacturing and Testing XIV

22 August 2022 | San Diego, California, United States

Optical Manufacturing and Testing XIII

24 August 2020 | Online Only, California, United States

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