Jun Xiong
at Chongqing Institute of Metrology and Quality Inspection
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 18 November 2024 Paper
Proceedings Volume 13398, 1339814 (2024) https://doi.org/10.1117/12.3049736
KEYWORDS: Film thickness, Thin films, Scanning electron microscopy, Ellipsometry, Electron microscopes, Nanofilms, Reflection, Systems modeling, Dispersion, Mathematical modeling

Proceedings Article | 11 October 2024 Paper
Proceedings Volume 13278, 132780U (2024) https://doi.org/10.1117/12.3032361
KEYWORDS: Atomic force microscopy, Standards development, Histograms, Calibration, Metrology, Equipment, Atomic force microscope, Inspection, Semiconductors, Measurement devices

Proceedings Article | 24 November 2021 Paper
Proceedings Volume 12060, 120600I (2021) https://doi.org/10.1117/12.2605338
KEYWORDS: Laser scanners, Edge detection, Laser optics, Prototyping, Inspection, Clouds, Scanners, Laser development, Computing systems, 3D scanning

Proceedings Article | 7 September 2021 Paper
Proceedings Volume 11828, 1182805 (2021) https://doi.org/10.1117/12.2597051
KEYWORDS: Laser scanners, 3D metrology, Laser applications, Inspection, Computing systems, Virtual reality, Prototyping, Laser optics, Control systems, 3D modeling

Proceedings Article | 10 October 2020 Poster + Presentation + Paper
Proceedings Volume 11552, 1155213 (2020) https://doi.org/10.1117/12.2573168
KEYWORDS: Calibration, 3D scanning, Optical scanning, Optical calibration, 3D metrology, Optical spheres, Optics manufacturing, Inspection, 3D imaging standards, Clouds

Showing 5 of 6 publications
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