Dr. Juraj Krempasky Profile

Dr. Juraj Krempasky

Scientist at Paul Scherrer Institut

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 16 June 2023 Presentation + Paper

SwissFEL KB-optics at-wavelength wavefront characterisation

J. Krempaský, J. Vonka, B. Pedrini, A. Steppke, U. Flechsig, R. Follath, B. Rösner, U. Wagner, C. David, M. Makita, P. Vagović

Proceedings Volume 12581, 125810A (2023) https://doi.org/10.1117/12.2665587

KEYWORDS: Wavefronts, Wavefront distortions, Free electron lasers, Deflectometry, Adaptive optics, Mirrors, X-rays, Interferograms, Charge-coupled devices, Optical gratings

Read Abstract +

Proceedings Article | 18 September 2018 Presentation + Paper

Inspecting adaptive optics with at-wavelength wavefront metrology

J. Krempaský, F. Koch, P. Vagovič, L. Mikeš, A. Jaggi, C. Svetina, U. Flechsig, L. Patthey, S. Marathe, D. Batey, S. Cipiccia, C. Rau, F. Seiboth, M. Seaberg, C. David, U. Wagner

Proceedings Volume 10761, 107610D (2018) https://doi.org/10.1117/12.2320532

KEYWORDS: Mirrors, X-rays, Adaptive optics, X-ray optics, Wavefront distortions, Wavefront analysis, Lenses, Wavefront metrology, Light sources, Wavefront aberrations

Read Abstract +

Proceedings Article | 28 September 2011 Paper

Heydemann interpolation correction for energy linearization of soft x-ray monochromators

J. Krempaský, R. Follath, V. N. Strocov, T. Schmitt, U. Flechsig

Proceedings Volume 8139, 81390K (2011) https://doi.org/10.1117/12.893464

KEYWORDS: Computer programming, Head, Mirrors, Monochromators, Spectroscopy, Autocollimators, Analog electronics, X-rays, Light sources, Calibration

Read Abstract +

Proceedings Article | 3 November 1997 Paper

System for controlling the variable-angle spherical-grating monochromators at Elettra

Juraj Krempasky, R. Krempaska, Andrea Bianco, A. Abrami, R. Pugliese, F. Bille, Juha Karvonen, M. Coreno, M. de Simone

Proceedings Volume 3150, (1997) https://doi.org/10.1117/12.279366

KEYWORDS: Monochromators, Mirrors, Calibration, Diffraction gratings, Computer programming, Control systems, Mathematical modeling, Diffraction, Optical encoders, Tolerancing

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years