Karim Tamssaouet
at BI Norwegian Business School
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 September 2024 Paper
Proceedings Volume 13273, 132730D (2024) https://doi.org/10.1117/12.3029925
KEYWORDS: Transportation, Semiconductor manufacturing, Diffusion, Source mask optimization, Reticles, Process modeling, Modeling, Inspection, Mathematical optimization, Lithography, Mask cleaning

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