Dr. Kawal Sawhney
Optics Group Leader at Diamond Light Source Ltd
SPIE Involvement:
Author | Editor
Publications (27)

Proceedings Article | 26 August 2024 Presentation
Proceedings Volume 13100, 131001J (2024) https://doi.org/10.1117/12.3020101

Proceedings Article | 3 October 2023 Open Access Presentation + Paper
Ioana-Theodora Nistea, Simon Alcock, Murilo Bazan da Silva, K. Sawhney
Proceedings Volume 12695, 126950A (2023) https://doi.org/10.1117/12.2688134
KEYWORDS: Autocollimators, Metrology, Profilometers, X-ray optics

Proceedings Article | 3 October 2023 Open Access Presentation + Paper
Proceedings Volume 12694, 1269409 (2023) https://doi.org/10.1117/12.2675894
KEYWORDS: Laser crystals, Liquid crystals

Proceedings Article | 24 August 2020 Presentation
David Laundy, Vishal Dhamgaye, Thomas Moxham, Kawal Sawhney
Proceedings Volume 11493, 114930I (2020) https://doi.org/10.1117/12.2571161
KEYWORDS: Wavefronts, X-ray optics, X-rays, Optical components, Optical testing, Optical simulations, Mirrors, Refraction, Diamond, Light sources

Proceedings Article | 21 August 2020 Open Access Presentation + Paper
John Sutter, Oleg Chubar, Alexey Suvorov, Christie Nelson, Kawal Sawhney
Proceedings Volume 11493, 114930V (2020) https://doi.org/10.1117/12.2567341
KEYWORDS: Wave plates, Crystals, Polarization, X-rays, Diffraction, Optical simulations, X-ray diffraction, Wavefronts

Showing 5 of 27 publications
Proceedings Volume Editor (4)

SPIE Conference Volume | 28 September 2020

SPIE Conference Volume | 10 November 2017

SPIE Conference Volume | 15 October 2014

SPIE Conference Volume | 8 September 2011

Conference Committee Involvement (22)
Advances in Metrology for X-Ray and EUV Optics XI
3 August 2025 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics X
23 August 2023 | San Diego, California, United States
Advances in Computational Methods for X-Ray Optics V
25 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Showing 5 of 22 Conference Committees
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