Kun-Hsien Lee
at National Central Univ
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 20 August 2010 Paper
Proceedings Volume 7786, 77860S (2010) https://doi.org/10.1117/12.860499
KEYWORDS: Oxides, Oxygen, Tungsten, Glasses, Ions, Thin films, Transmittance, Electron beams, Modulation, Zinc oxide

Proceedings Article | 20 August 2010 Paper
Proceedings Volume 7786, 77860N (2010) https://doi.org/10.1117/12.860472
KEYWORDS: Reflectivity, Niobium, Dielectrics, Thin films, Silica, Antireflective coatings, Organic light emitting diodes, Aluminum, Reflection, Refractive index

SPIE Journal Paper | 1 June 2010
OE, Vol. 49, Issue 06, 063802, (June 2010) https://doi.org/10.1117/12.10.1117/1.3456708
KEYWORDS: Ion beams, Refractive index, Silicon, Thin films, Argon, Silicon films, Interfaces, Radio optics, Sputter deposition, Ions

Proceedings Article | 29 August 2008 Paper
Proceedings Volume 7067, 70670K (2008) https://doi.org/10.1117/12.795846
KEYWORDS: Ion beams, Refractive index, Argon, Thin films, Sputter deposition, Interfaces, Silicon, Optical properties, Ions, Nitrogen

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