Kurt W. Larson
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 February 2013 Paper
Hyrum Anderson, Jovana Ilic-Helms, Brandon Rohrer, Jason Wheeler, Kurt Larson
Proceedings Volume 8657, 86570C (2013) https://doi.org/10.1117/12.2008313
KEYWORDS: Scanning electron microscopy, Image restoration, Compressed sensing, Sensors, Electron microscopes, Electron microscopy, Image compression, Raster graphics, Atomic force microscopy, Signal to noise ratio

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