Photon counting detectors with energy resolving capabilities have the potential to improve computed tomography (CT) imaging and x-ray diffraction (XRD) systems. In order to better understand the use of these detectors in the CT and XRD application spaces, we have experimentally investigated the detector performance of two newly-released photon counting detectors: the Redlen LDA detector and the Kromek D-Matrix v2 detector. Detector performance involves a complicated interplay of semiconductor physics and readout electronics, and the outcome can depend crucially on the properties of the incoming X-rays—specifically the flux and spectral content. Although the LDA and D-Matrix v2 detectors differ in many ways, particularly in the manner in which they collect spectroscopic information, both are of interest for CT and XRD modalities. We report on our analysis of the detector performance, including the noise statistics, detector quantum efficiency, response linearity, and energy resolution of the detectors as well as discuss how our findings influence the use of these detectors in diffraction and transmission measurements.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.