Dr. Liansheng Zhang Profile

Dr. Liansheng Zhang

at Hefei University of Technology

SPIE Involvement:

Author

Publications (8)

Proceedings Article | 13 September 2024 Paper

Parameter estimation method of multidimensional measurement model with small sample based on MCM

Zhihao Zhao, Zhiwen Chen, Zuyang Zhang, Qiangxian Huang, Hongli Li, Rongjun Cheng, Liansheng Zhang

Proceedings Volume 13178, 131781S (2024) https://doi.org/10.1117/12.3032736

KEYWORDS: Statistical modeling, Monte Carlo methods, Statistical analysis, Measurement uncertainty, Data modeling, Matrices, Linear regression, Engineering, Data acquisition

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Proceedings Article | 19 November 2021 Paper

Design of a high-precision two-dimensional coplanar micro-vibration generator

Lian-sheng Zhang, Ke-Wei Bian, Ying-jun Lei, Rui-Jun Li, Kuang-Chao Fan

Proceedings Volume 12059, 120591L (2021) https://doi.org/10.1117/12.2612275

KEYWORDS: Actuators, Structural design, Control systems, Sensors, Calibration, Standards development, Control systems design

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Proceedings Article | 19 November 2021 Paper

Calculation method of projection point of circle center in camera calibration

Kui Wu, Qiancheng Ying, Wenqian Wang, Liansheng Zhang, Rongjun Cheng, Qiangxian Huang

Proceedings Volume 12059, 120590A (2021) https://doi.org/10.1117/12.2611313

KEYWORDS: Cameras, Calibration, Mathematical modeling, Algorithms, Vision geometry

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Proceedings Article | 19 November 2021 Paper

A path planning method for real time correction of image distortion in atomic force microscope

Lian-Sheng Zhang, Jun-Jie Yan, Ying-Jun Lei, Rui-Jun Li, Qiang-Xian Huang

Proceedings Volume 12059, 1205921 (2021) https://doi.org/10.1117/12.2617305

KEYWORDS: Distortion, Atomic force microscope, Atomic force microscopy, Scanning probe microscopes, Raster graphics, Scanning probe microscopy, Image quality, Sensors, Scanning tunneling microscopy, Scanning electron microscopy

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