Prof. Lianwei Wang
Research Fellow at East China Normal Univ
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 16 December 2013 Paper
Xuefeng Lou, Shaohui Xu, Yiping Zhu, Lianwei Wang, Paul Chu
Proceedings Volume 9068, 90681Q (2013) https://doi.org/10.1117/12.2053841
KEYWORDS: Electrodes, Microchannel plates, Lithium, Tin, Silicon, Nickel, Scanning electron microscopy, Thin films, Neodymium, Oxidation

Proceedings Article | 16 December 2013 Paper
Keshuang Hui, Yiping Zhu, Shaohui Xu, Lianwei Wang, Paul Chu
Proceedings Volume 9068, 90681P (2013) https://doi.org/10.1117/12.2053840
KEYWORDS: Capacitance, Electrodes, Oxides, Scanning electron microscopy, Tin, Microchannel plates, Resistance, Nickel, Dielectric spectroscopy, Silicon

SPIE Journal Paper | 1 July 2009
Ding Yuan, Pengliang Ci, Fei Tian, Jing Shi, Shaohui Xu, Peisheng Xin, Lianwei Wang, Paul Chu
JM3, Vol. 8, Issue 03, 033012, (July 2009) https://doi.org/10.1117/12.10.1117/1.3158616
KEYWORDS: Etching, Microchannel plates, Silicon, Lamps, Semiconducting wafers, Scanning electron microscopy, Halogens, High aspect ratio silicon micromachining, Electrochemical etching, Scattering

Proceedings Article | 11 March 2008 Paper
Tingting Liu, Tao Liu, Jinlong Li, Jilei Lin, Xiaoming Chen, Xinglong Guo, Peisheng Xin, Shaohui Xu, Weijia Xue, Lianwei Wang
Proceedings Volume 6984, 69843M (2008) https://doi.org/10.1117/12.792237
KEYWORDS: Silicon, Sensors, 3D metrology, Diffusion, Phosphorus, Computer simulations, Semiconductors, Energy conversion efficiency, Device simulation, Lithography

Proceedings Article | 11 March 2008 Paper
Liang Xu, Jinchuan You, Lianwei Wang
Proceedings Volume 6984, 69842Z (2008) https://doi.org/10.1117/12.792382
KEYWORDS: Silicon, Nanostructures, Electrochemical etching, Semiconducting wafers, Etching, Computing systems, Scanning electron microscopy, Nanolithography, Bioalcohols, Dry etching

Showing 5 of 10 publications
Proceedings Volume Editor (1)

Conference Committee Involvement (1)
Fifth International Conference on Thin Film Physics and Applications
31 May 2004 | Shanghai, China
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