Prof. Masato Aketagawa
Professor at Nagaoka Univ of Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (22)

Proceedings Article | 27 October 2021 Paper
Masato Aketagawa, Masato Higuchi, Tomohiro Sowa, Dong Wei
Proceedings Volume 11927, 119270K (2021) https://doi.org/10.1117/12.2616268
KEYWORDS: Interferometers, Scanning probe microscopy, Phase shift keying, Phase modulation, Field programmable gate arrays, Mirrors, Modulation, Linear filtering, Light sources, Fiber lasers

Proceedings Article | 27 October 2021 Paper
Masato Aketagawa, Kousuke Sakasai, Masato Higuchi, Dong Wei, Thanh Nguyen
Proceedings Volume 11927, 119270D (2021) https://doi.org/10.1117/12.2616260
KEYWORDS: Interferometers, Heterodyning, Environmental sensing, Ferroelectric materials, Field programmable gate arrays, Bragg cells, Retroreflectors, Reflectors, Photodetectors, Modulators

Proceedings Article | 27 October 2021 Paper
Masato Aketagawa, Masato Higuchi, Tomohiro Sowa, Dong Wei
Proceedings Volume 11927, 119270K (2021) https://doi.org/10.1117/12.2616268
KEYWORDS: Interferometers, Scanning probe microscopy, Phase shift keying, Phase modulation, Field programmable gate arrays, Mirrors, Modulation, Linear filtering, Light sources, Fiber lasers

SPIE Journal Paper | 8 March 2021
Dong Wei, Yusuke Nagata, Motohisa Sano, Masato Aketagawa
OE, Vol. 60, Issue 03, 034105, (March 2021) https://doi.org/10.1117/12.10.1117/1.OE.60.3.034105
KEYWORDS: Interference (communication), Fourier transforms, Bandpass filters, Fringe analysis, Signal detection, Optical engineering, Superposition, Mirrors, Interferometry, Interferometers

Proceedings Article | 21 June 2019 Presentation + Paper
Masato Aketagawa, Masato Higuchi, Dong Wei
Proceedings Volume 11056, 110560F (2019) https://doi.org/10.1117/12.2525200
KEYWORDS: Modulation, Interferometers, Field programmable gate arrays, Demodulation, Frequency modulation, Phase modulation

Showing 5 of 22 publications
Conference Committee Involvement (16)
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Optical Technology and Measurement for Industrial Applications Conference
22 April 2024 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Optical Technology and Measurement for Industrial Applications Conference
17 April 2023 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications IX
5 December 2022 | Online Only, China
Showing 5 of 16 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top