Dr. Masayuki Yamamoto Profile

Dr. Masayuki Yamamoto

Owner at Softron Corp

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Publications (16)

Proceedings Article | 12 October 2006 Paper

Inner profile measurement of pipes and holes using a ring beam device

Toru Yoshizawa, Masayuki Yamamoto, Toshitaka Wakayama

Proceedings Volume 6382, 63820D (2006) https://doi.org/10.1117/12.689317

KEYWORDS: Mirrors, Inspection, CCD cameras, Cameras, Prisms, Optical fabrication equipment, Polishing, Optical testing, Charge-coupled devices, Liquids

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Proceedings Article | 7 March 2006 Paper

Three-dimensional profilometry using moire pattern projection

Toru Yoshizawa, Takayoshi Yamaguchi, Masayuki Yamamoto, Yukitoshi Otani

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498432

KEYWORDS: Moire patterns, Binary data, Phase shifts, 3D metrology, Phase shifting, Liquid crystals, Prototyping, Fringe analysis, Phase measurement, Electronics

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Proceedings Article | 7 November 2005 Paper

Surface profile measurement by grating projection method with dual-projection optics

Masayuki Yamamoto, Toru Yoshizawa

Proceedings Volume 6000, 60000I (2005) https://doi.org/10.1117/12.630206

KEYWORDS: Calibration, Cameras, Liquid crystals, Image processing, 3D image processing, Projection systems, Phase measurement, Software, Reflectivity, Time metrology

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Proceedings Article | 19 August 2005 Paper

Simultaneous measurement of a profile shape and deformation of an object by processing projected pattern and texture pattern

Toru Yoshizawa, Masayuki Yamamoto, Takahiro Ikeda

Proceedings Volume 5880, 588003 (2005) https://doi.org/10.1117/12.616199

KEYWORDS: Medical research, Fringe analysis, Speckle pattern, Mouth, Teeth, Mechanical engineering, Life sciences, Skin, CCD cameras, Image processing

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Proceedings Article | 23 October 2003 Paper

Three-dimensional imaging using liquid crystal grating projection

Toru Yoshizawa, Hiroo Fujita, Yukitoshi Otani, Masayuki Yamamoto

Proceedings Volume 5202, (2003) https://doi.org/10.1117/12.505287

KEYWORDS: Liquid crystals, Phase shifting, 3D image processing, Modulation, Transmittance, Projection systems, 3D metrology, Binary data, CCD cameras, Eye

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Proceedings Article | 29 April 2003 Paper

Three-dimensional profilometry using liquid crystal grating

Hiroo Fujita, Ken Yamatan, Masayuki Yamamoto, Yukitoshi Otani, Akira Suguro, Shigeru Morokawa, Toru Yoshizawa

Proceedings Volume 5058, (2003) https://doi.org/10.1117/12.509410

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Proceedings Article | 18 October 2002 Paper

Miniaturized machine moving in a pipe using photothermal effect

Toru Yoshizawa, Tomohiko Usui, Masayuki Yamamoto, Daisuke Hayashi

Proceedings Volume 4902, (2002) https://doi.org/10.1117/12.467629

KEYWORDS: Shape memory alloys, Photothermal effect, Head, Magnetism, Prototyping, Halogens, Lamps, Opto mechatronics, Carbon, Beam shaping

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Proceedings Article | 18 October 2002 Paper

Surface profile measurement of concave-shaped mirror using grating projection method

Masayuki Yamamoto, Masahito Tonooka, Toru Yoshizawa

Proceedings Volume 4902, (2002) https://doi.org/10.1117/12.467533

KEYWORDS: Mirrors, Opto mechatronics, Selenium, Time metrology

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Proceedings Article | 11 February 2002 Paper

Surface profile measurement of specular objects by grating projection method

Masayuki Yamamoto, Masahito Tonooka, Toru Yoshizawa

Proceedings Volume 4567, (2002) https://doi.org/10.1117/12.455240

KEYWORDS: CCD cameras, Reflectivity, Silicon, Semiconducting wafers, CCD image sensors, Imaging systems, Mirrors, Phase measurement, 3D image processing, Phase shifts

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Proceedings Article | 11 February 2002 Paper

Structured lighting method using moire pattern projection

Toru Yoshizawa, Takayoshi Yamaguchi, Hiroshi Takahashi, Naohito Ikeda, Masayuki Yamamoto, Shigeru Nagamori

Proceedings Volume 4567, (2002) https://doi.org/10.1117/12.455239

KEYWORDS: Binary data, Moire patterns, Liquid crystals, Phase shifts, Light sources and illumination, Projection systems, Transmittance, CCD cameras, Prototyping, 3D metrology

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Proceedings Article | 26 November 2001 Paper

Optical fiber strain gauge using a mirror with a pinhole

Toru Yoshizawa, Hiroshi Takase, Masayuki Yamamoto, Yukitoshi Otani

Proceedings Volume 4448, (2001) https://doi.org/10.1117/12.449364

KEYWORDS: Optical fibers, Mirrors, Resistance, Copper, Sensors, Light, Fiber optics, Signal detection, Systems engineering, Metals

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Proceedings Article | 23 October 2001 Paper

Three-dimensional profilometry using hybrid grating projection

Toru Yoshizawa, Hiroshi Takahashi, Masayuki Yamamoto, Yukitoshi Otani, Hiroo Fujita

Proceedings Volume 4398, (2001) https://doi.org/10.1117/12.445552

KEYWORDS: Moire patterns, Binary data, Liquid crystals, Phase shifts, Transmittance, Prototyping, CCD cameras, Projection systems, Phase shifting, 3D metrology

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Proceedings Article | 4 October 2001 Paper

Walking machine driven by a light beam

Toru Yoshizawa, Daisuke Hayashi, Masayuki Yamamoto, Yukitoshi Otani

Proceedings Volume 4564, (2001) https://doi.org/10.1117/12.444091

KEYWORDS: Prototyping, Shape memory alloys, Beam shaping, Magnetism, Switching, Carbon, Halogens, Lamps, Opto mechatronics, Optical actuators

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Proceedings Article | 11 November 1999 Paper

Three-dimensional surface profilometry using structured liquid crystal grating

Ken Yamatani, Hiroo Fujita, Masayuki Yamamoto, Akira Suguro, Yukitoshi Otani, Shigeru Morokawa, Toru Yoshizawa

Proceedings Volume 3782, (1999) https://doi.org/10.1117/12.369195

KEYWORDS: Liquid crystals, Phase shifting, Projection systems, CCD cameras, Phase measurement, Optical filters, Phase shifts, Glasses, 3D metrology, Crystals

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Proceedings Article | 7 May 1999 Paper

Three-dimensional surface measurement using grating projection method by detecting phase and contrast

Mitsuhiro Ishihara, Yasuo Nakazato, Hiromi Sasaki, Masahito Tonooka, Masayuki Yamamoto, Yukitoshi Otani, Toru Yoshizawa

Proceedings Volume 3740, (1999) https://doi.org/10.1117/12.347778

KEYWORDS: Phase measurement, Phase shifting, Objectives, Confocal microscopy, CCD cameras, Glasses, Systems engineering, Optics manufacturing, Manufacturing, Inspection

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Proceedings Article | 30 June 1998 Paper

Precise measurement of nonoptical surfaces by an oblique incidence interferometer

Yukitoshi Otani, Toyoaki Kuwahara, Masayuki Yamamoto, Toru Yoshizawa

Proceedings Volume 3478, (1998) https://doi.org/10.1117/12.312939

KEYWORDS: Interferometers, Silicon, Semiconducting wafers, Prisms, Reflection, Spatial filters, Phase shifts, Phase shifting, Inspection, CCD cameras

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Showing 5 of 16 publications

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