Dr. Matti Niskanen Profile

Dr. Matti Niskanen

at Visidon Ltd

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 27 February 2008 Paper

New video applications on mobile communication devices

Olli Silvén, Jari Hannuksela, Miguel Bordallo-López, Markus Turtinen, Matti Niskanen, Jani Boutellier, Markku Vehviläinen, Marius Tico

Proceedings Volume 6821, 682108 (2008) https://doi.org/10.1117/12.764872

KEYWORDS: Cameras, Video, Human-machine interfaces, Mobile devices, Panoramic photography, Facial recognition systems, Mobile communications, Image processing, Image resolution, Motion estimation

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Proceedings Article | 1 May 2003 Paper

Comparison of dimensionality reduction methods for wood surface inspection

Matti Niskanen, Olli Silven

Proceedings Volume 5132, (2003) https://doi.org/10.1117/12.514959

KEYWORDS: Visualization, Inspection, Associative arrays, Principal component analysis, Optical inspection, Machine learning, Human-machine interfaces, Data mining, Defect detection, Geodesy

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Proceedings Article | 1 May 2003 Paper

Texture-based paper characterization using nonsupervised clustering

Markus Turtinen, Matti Pietikaeinen, Olli Silven, Topi Maenpaa, Matti Niskanen

Proceedings Volume 5132, (2003) https://doi.org/10.1117/12.515125

KEYWORDS: Inspection, Feature extraction, Binary data, Human-machine interfaces, Optical inspection, Image segmentation, Machine vision, Scene classification, Visualization, Volume rendering

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Proceedings Article | 1 May 2003 Paper

Framework for industrial visual surface inspections

Olli Silven, Matti Niskanen

Proceedings Volume 5132, (2003) https://doi.org/10.1117/12.514928

KEYWORDS: Inspection, Optical inspection, Visualization, Defect detection, Human-machine interfaces, Feature extraction, Machine vision, Electronics, Imaging systems, Particles

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Proceedings Article | 8 March 2002 Paper

Real-time aspects of SOM-based visual surface inspection

Matti Niskanen, Hannu Kauppinen, Olli Silven

Proceedings Volume 4664, (2002) https://doi.org/10.1117/12.460189

KEYWORDS: Inspection, Optical inspection, Visualization, System on a chip, Quantization, Human-machine interfaces, Image resolution, Principal component analysis, Error analysis, Distance measurement

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