Mike Zhu
at MIT Lincoln Lab
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 13 December 2020 Presentation + Paper
C. Leitz, K. Donlon, D. Young, R. Lambert, M. Collins, B. Burke, M. Zhu, S. Rabe, M. Cooper, D. O'Mara
Proceedings Volume 11454, 114541B (2020) https://doi.org/10.1117/12.2562583
KEYWORDS: Charge-coupled devices, Semiconducting wafers, Germanium, Back end of line, Silicon, Atomic layer deposition, Sensors, Reticles, Hard x-rays, Back illuminated sensors

Proceedings Article | 9 September 2019 Presentation + Paper
C. Leitz, M. Zhu, S. Rabe, B. Burke, D. Young, D. O'Mara, I. Prigozhin, K. Ryu, M. Cooper, R. Reich, K. Johnson, M. Cook, C. Stull, S. Zarr
Proceedings Volume 11118, 1111802 (2019) https://doi.org/10.1117/12.2528158
KEYWORDS: Charge-coupled devices, Germanium, Silicon, Semiconducting wafers, Metals, X-rays, X-ray detectors, Particles, Sensors, Lithography

Proceedings Article | 6 July 2018 Paper
K. Ryu, C. Leitz, H. Clark, X. Chen, M. Cooper, M. Zhu, P. Welander, R. Lambert, V. Bolkhovsky, D.-R. Yost, B. Burke, J. Gregory, V. Suntharalingam
Proceedings Volume 10699, 106993P (2018) https://doi.org/10.1117/12.2311512
KEYWORDS: Semiconducting wafers, Charge-coupled devices, Hydrogen, Oxides, Silicon, Quantum efficiency, Wafer bonding, Ultraviolet radiation, Interfaces, Plasma enhanced chemical vapor deposition, Molecular beam epitaxy

Proceedings Article | 6 July 2018 Presentation + Paper
C. Leitz, M. Zhu, S. Rabe, B. Burke, I. Prigozhin, D. O'Mara, K. Ryu, M. Cooper, R. Reich, K. Johnson, W. Hu, B. Felton, M. Cook, C. Stull, V. Suntharalingam
Proceedings Volume 10709, 1070908 (2018) https://doi.org/10.1117/12.2310120
KEYWORDS: Charge-coupled devices, Germanium, X-rays, X-ray detectors

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