Mingzhu Xu
at Nanjing University of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 October 2020 Paper
Proceedings Volume 11571, 1157115 (2020) https://doi.org/10.1117/12.2580538
KEYWORDS: 3D metrology, Facial recognition systems, Projection systems, 3D image processing, Infrared radiation, Fringe analysis

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