Dr. Myunghee Na
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 April 2021 Presentation + Paper
Bilal Chehab, Julien Ryckaert, Pieter Schuddinck, Pieter Weckx, Naoto Horiguchi, Gioele Mirabelli, Alessio Spessot, Myunghee Na
Proceedings Volume 11614, 116140D (2021) https://doi.org/10.1117/12.2583395
KEYWORDS: Back end of line, Standards development, Metals, Field effect transistors, Multiplexers, Logic, Fin field effect transistors, Dielectrics, Control systems, Clocks

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