Nick G. Wakefield
Graduate Student at Univ of Alberta
SPIE Involvement:
Author
Publications (4)

SPIE Journal Paper | 17 June 2015
JM3, Vol. 14, Issue 02, 024001, (June 2015) https://doi.org/10.1117/12.10.1117/1.JMM.14.2.024001
KEYWORDS: Semiconducting wafers, Micro raman spectroscopy, Raman spectroscopy, Silicon, Copper, Microelectromechanical systems, Deep reactive ion etching, Low pressure chemical vapor deposition, Annealing, Boron

Proceedings Article | 1 March 2011 Paper
Viktor Leontyev, Matthew Hawkeye, Nicholas Wakefield, Kyrylo Tabunshchyk, Jeremy Sit, Andriy Kovalenko, Michael Brett
Proceedings Volume 7946, 79461Y (2011) https://doi.org/10.1117/12.873958
KEYWORDS: Refractive index, Polarization, Finite-difference time-domain method, Polarizers, Anisotropy, Thin films, Birefringence, Numerical simulations, Crystals, Titanium dioxide

Proceedings Article | 12 September 2007 Paper
Proceedings Volume 6654, 665404 (2007) https://doi.org/10.1117/12.735265
KEYWORDS: Liquid crystals, Polymethylmethacrylate, Polarization, Thin films, Molecules, Silicon films, Optical properties, Silicon, Oxides, Nanostructures

Proceedings Article | 23 February 2006 Paper
Proceedings Volume 6135, 61350G (2006) https://doi.org/10.1117/12.646458
KEYWORDS: Transmittance, Liquid crystals, Molecules, Optical properties, Polarization, Refractive index, Nanostructures, Switches, Absorption, Scanning electron microscopy

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