Dr. Nicola Renso Profile

Dr. Nicola Renso

at Univ degli Studi di Padova

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Author

Publications (5)

Proceedings Article | 25 February 2020 Paper

Dependence of degradation on InGaN quantum well position: a study based on color coded structures

Alessandro Caria, Nicola Renso, Carlo De Santi, Francesco Dalla Torre, Lorenzo Zecchin, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Proceedings Volume 11302, 113020X (2020) https://doi.org/10.1117/12.2547251

KEYWORDS: Quantum wells, Indium gallium nitride, Light emitting diodes, Gallium nitride

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Proceedings Article | 1 March 2019 Paper

Origin of the low-forward leakage current in InGaN-based LEDs

Carlo De Santi, Matteo Buffolo, Nicola Renso, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Proceedings Volume 10940, 109400J (2019) https://doi.org/10.1117/12.2509513

KEYWORDS: Quantum wells, Electroluminescence, Light emitting diodes, Luminescence, Gallium nitride, Blue light emitting diodes, Optoelectronic devices

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Proceedings Article | 1 March 2019 Presentation + Paper

Challenges for highly reliable GaN-based LEDs

Enrico Zanoni, Carlo De Santi, Nicola Trivellin, Nicola Renso, Matteo Buffolo, Desiree Monti, Alessandro Caria, Francesco Piva, Gaudenzio Meneghesso, Matteo Meneghini

Proceedings Volume 10940, 109400I (2019) https://doi.org/10.1117/12.2507533

KEYWORDS: Light emitting diodes, Diffusion, Reliability, Hydrogen, Semiconductor lasers, Photons, Optoelectronic devices, Thermography, Luminescence, Metals

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Proceedings Article | 1 March 2019 Paper

Evidence for avalanche generation in reverse-biased InGaN LEDs

N. Renso, C. De Santi, P. Dalapati, D. Monti, M. Binder, B. Galler, R. Zeisel, G. Meneghesso, E. Zanoni, M. Meneghini

Proceedings Volume 10940, 109401Y (2019) https://doi.org/10.1117/12.2511152

KEYWORDS: Light emitting diodes, Gallium nitride, Electroluminescence, Electrons, Indium gallium nitride, Blue light emitting diodes, Photons, Luminescence, Numerical simulations

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Proceedings Article | 16 February 2017 Presentation + Paper

Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress

Carlo De Santi, Matteo Meneghini, Nicola Renso, Matteo Buffolo, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Andrea Migliori, Vittorio Morandi, Gaudenzio Meneghesso, Enrico Zanoni

Proceedings Volume 10124, 101240F (2017) https://doi.org/10.1117/12.2256023

KEYWORDS: Light emitting diodes, Indium gallium nitride, Dielectrics, Blue light emitting diodes, Electroluminescence, Electrical breakdown, Manufacturing, LED lighting, Solid state lighting, Gallium nitride, Failure analysis, Reliability, Transistors, Scanning electron microscopy, Semiconductors

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