We developed an analysis system for simulating birefringence of an annealed ingot of CaF2 single crystal caused by the
residual stress after annealing process. The analysis system comprises the heat conduction analysis that provides the
temperature distribution during the ingot annealing, the stress analysis to calculate the residual stress after ingot
annealing, and the birefringence analysis of an annealed ingot induced by the residual stress. In the residual stress
calculation, we can select either the elastic thermal stress analysis using the assumption of a stress-free temperature or
more exact stress analysis considering the time-dependent nonlinear behavior of a material called creep. When we use
the residual stress calculated from the creep deformation analysis of a CaF2 ingot, we can obtain reasonable results both
for the optical path difference values and for its distributions in comparison with the experimental results.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.